Semiconductor memory device and method for testing semiconductor memory device
AssigneeLapis Semiconductor Co., Ltd.
InventorShuhei Kamano
Life of this patent
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Abstract
A semiconductor memory device includes: a memory cell including a first cell that stores data, and a second cell that stores complementary data that is complementary to the data; a redundant memory cell including a third cell that stores margined complementary data in which a margin is added to the complementary data, and a fourth cell that stores margined data in which a margin is added to the data; and a controller that causes the data and the margined complementary data to be compared and a test of the first cell to be executed, and the complementary data and the margined data to be compared and a test of the second cell to be executed.
Claims5
A semiconductor memory device comprising:
- a memory cell including a first cell that stores data, and a second cell that stores complementary data that is complementary to the data;
- a redundant memory cell including a third cell that stores margined complementary data in which a margin is added to the complementary data, and a fourth cell that stores margined data in which a margin is added to the data;
- and
- a controller that causes the data and the margined complementary data to be compared and a test of the first cell to be executed, and the complementary data and the margined data to be compared and a test of the second cell to be executed.
A testing method of a semiconductor memory device, the semiconductor memory device including:
- a memory cell including a first cell that stores data and a second cell that stores complementary data that is complementary to the data;
- and a redundant memory cell including a third cell that stores margined complementary data in which a margin is added to the complementary data, and a fourth cell that stores margined data in which a margin is added to the data, the method comprising:
- causing, by a controller, the data and the margined complementary data to be compared and a test of the first cell to be executed, and the complementary data and the margined data to be compared and a test of the second cell to be executed.
Dependencies are inferred from the claim text.