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AssigneeRenesas Electronics Corporation
InventorsKotaro Sakumura, Yasutaka Horikoshi, Hiroshi Tachibana, Keita Kashima
Estimating the term…
A malfunction caused by sharp fluctuations in current is prevented while suppressing an increase in circuit size. A semiconductor device includes a plurality of modules. The semiconductor device includes: a table that stores a plurality of operating frequencies in each of the modules and a plurality of scores determined based on the operating frequencies such that the operating frequencies and the scores are associated with each other for each of the modules; a score specifying unit that acquires the clock operating frequencies of the modules and specifies the scores based on the clock operating frequencies with reference to the table; and an output unit that outputs an instruction to activate the modules at different times if the specified scores exceed a predetermined threshold value.
A semiconductor device comprising a plurality of modules,
A method of controlling a semiconductor device comprising a table that stores a plurality of operating frequencies for a plurality of modules and a plurality of scores determined based on the operating frequencies such that the operating frequencies and the scores are associated with each other for each of the modules,
Dependencies are inferred from the claim text.