System and method for capture of high resolution/high magnification images

A method for inspecting objects, the method comprising:

• obtaining angular information defining a spatial relationship between a first aiming subsystem and predetermined features and angular information between a second aiming subsystem and a surface on which an object is disposed and the object;
• the predetermined features being located on the surface on which the object is disposed and on the object;
• the first aiming subsystem optically operatively disposed to receive electromagnetic radiation from a first source of electromagnetic radiation;
• the first aiming subsystem optically aiming the electromagnetic radiation from the first source onto the surface on which the object is disposed;
• the second aiming subsystem optically operatively disposed such that the second aiming subsystem aims an optical field of a first image acquisition component to locations on the surface on which the object is disposed and on the object;
• wherein the first image acquisition component comprises an electronic camera with a lens;
• determining a common coordinate system for the object, the first aiming subsystem and the second aiming subsystem using photogrammetric transforms;
• aiming the electromagnetic radiation from the first source to illuminate inspection reference patterns on the surface of the object substantially simultaneous with aiming of the optical field of the first image acquisition component;
• and
• capturing calibrated images of features on the object;
• the calibrated images generated by illumination of inspection reference patterns;
• wherein the common coordinate system results in dimensioning each pixel in the calibrated image captured by the first image acquisition component;
• wherein the determining the common coordinate system and control of aiming and capturing is performed by a computing component configured to perform these tasks.

A method for inspecting objects, the method comprising:

• obtaining angular information defining a spatial relationship between a first aiming subsystem and predetermined features and angular information between a second aiming subsystem and a surface on which an object is disposed and the object;
• the predetermined features being located on the surface on which the object is disposed and on the object;
• the first aiming subsystem optically operatively disposed to receive electromagnetic radiation from a first source of electromagnetic radiation;
• the first aiming subsystem optically aiming the electromagnetic radiation from the first source onto the surface on which the object is disposed;
• the second aiming subsystem optically operatively disposed such that the second aiming subsystem aims an optical field of a first image acquisition unit to locations on the surface of which the object is disposed and on the object;
• wherein the first image acquisition component comprises an electronic camera with a lens;
• determining a common coordinating system for the object, the first aiming subsystem and the second aiming subsystem using photogrammetric transform;
• aiming the electromagnetic radiation from the first source to illuminate inspection reference patterns on the surface of the object substantially simultaneous with aiming of the optical field of the first image acquisition unit;
• capturing calibrated images of features on the object;
• the calibrated images generated by illumination of inspection reference patterns;
• obtaining angular information defining a spatial relationship between a third aiming subsystem and predetermined features and angular information between a fourth aiming subsystem and a surface on which an object is disposed and the object;
• the predetermined features being located on the surface on which the object is disposed and on the object;
• the third aiming subsystem optically operatively disposed to receive electromagnetic radiation from a second source of electromagnetic radiation;
• the third aiming subsystem optically aiming the electromagnetic radiation from the second source onto the surface on which the object is disposed;
• the fourth aiming subsystem optically operatively disposed such that the fourth aiming subsystem aims an optical field of a second image acquisition component to locations on the surface on which the object is disposed and on the object;
• wherein the second image acquisition component comprises an electronic camera with a lens;
• and
• aiming the electromagnetic radiation from the second source to illuminate inspection reference patterns on the surface of the object substantially simultaneous with aiming of the optical field of the second image acquisition component;
• wherein the common coordinate system results in dimensioning each pixel in the calibrated image captured by the image acquisition unit;
• wherein the determining the common coordinate system and control of aiming and capturing is performed by a computing unit configured to perform these tasks;
• and
• wherein the common coordinate system is the common coordinate system for the object, the first aiming subsystem, the second aiming subsystem, the third aiming subsystem and the fourth aiming subsystem.