Semiconductor device
AssigneeRenesas Electronics Corporation
InventorShinichi Suzuki
Life of this patent
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Abstract
A semiconductor device includes a first timer that includes a first counter, a second timer that includes a second counter and a controller that includes a CPU in provision of a technology for efficiently diagnosing a fault of a timer that is built in the semiconductor device such as a microcontroller and so forth. The first timer performs time synchronization with the time of external equipment arranged outside the semiconductor device. The controller compares a count value of the first counter with a count value of the second counter and detects a malfunction of the second timer on the basis of a result of comparison.
Claims20
A semiconductor device comprising:
- a first timer that includes a first counter and performs time synchronization with the time of external equipment that is arranged outside the semiconductor device;
- a second timer that includes a second counter;
- and
- a CPU programmed to compare a count value of the first counter with a count value of the second counter and detect a malfunction of the second timer on the basis of a result of comparison,
- wherein the CPU is further programmed to read out the count value of the first counter and the count value of the second counter with an interrupt that the first timer generates on the basis of the time synchronization, obtain a counter difference between the first counter and the second counter on the basis of the read-out count values, and detect the malfunction of the second timer when the counter difference is larger than a predetermined value.
A semiconductor device comprising:
- a first timer that includes a first counter and performs time synchronization with the time of external equipment that is arranged outside the semiconductor device;
- a second timer that includes a second counter;
- and
- a CPU programmed to compare a count value of the first counter with a count value of the second counter and detect a malfunction of the second timer on the basis of a result of comparison,
- wherein the first timer performs time synchronization in accordance with a time synchronization protocol (PTP) on a network and adjusts the count value of the first counter to the time of the external equipment.
A semiconductor device comprising:
- a first timer that includes a first counter and a pulse output timer and performs time synchronization with the time of external equipment that is arranged outside the semiconductor device;
- a second timer that includes a second counter, a third counter and a fourth counter;
- a first I/O port that outputs a first pulse that is generated by the pulse output timer;
- a second I/O port that outputs a second pulse that is generated on the basis of counting of the second counter;
- a third I/O port that inputs the first pulse that is output from the first I/O port;
- a fourth I/O port that inputs the second pulse that is output from the second I/O port;
- and
- a CPU,
- wherein the third counter counts a pulse width of the first pulse that is input from the third I/O port,
- wherein the fourth counter counts a pulse width of the second pulse that is input from the fourth I/O port, and
- wherein the CPU is programmed to compare a count value of the third counter with a count value of the fourth counter and detect a malfunction of the second timer on the basis of a result of comparison.
Dependencies are inferred from the claim text.