Temperature control method, control apparatus, and plasma processing apparatus
AssigneeTokyo Electron Limited
InventorsTatsuya Miura, Wataru Ozawa, Kimihiro Fukasawa, Kazunori Kazama
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AssigneeTokyo Electron Limited
InventorsTatsuya Miura, Wataru Ozawa, Kimihiro Fukasawa, Kazunori Kazama
Estimating the term…
A temperature control method is provided for controlling a plasma processing apparatus that is capable of changing a temperature setting for each step of a plasma process including multiple steps. The method includes a transfer step of performing an entry process for transferring a workpiece into a processing chamber of the plasma processing apparatus and/or an exit process for transferring the workpiece out of the processing chamber, a process execution step of executing the plasma process including multiple steps, and a temperature control step of performing a first temperature control and/or a second temperature control. The first temperature control includes controlling a temperature to a temperature setting of a next process according to a time execution of the plasma process is completed, and the second temperature control includes controlling the temperature to the temperature setting of the next process in parallel with the entry process and/or the exit process.
A temperature control method for controlling a plasma processing apparatus that performs a plasma process including a plurality of steps on a workpiece and is capable of changing a temperature setting for each step of the plasma process, the temperature control method comprising:
A control apparatus used in a plasma processing apparatus that performs a plasma process including a plurality of steps on a workpiece and is capable of changing a temperature setting for each step of the plasma process, the control apparatus comprising:
A plasma processing apparatus comprising:
Dependencies are inferred from the claim text.