Board processing apparatus, board processing method, and board processing system
AssigneeSCREEN Holdings Co., Ltd.
InventorTakashi Koshida
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AssigneeSCREEN Holdings Co., Ltd.
InventorTakashi Koshida
Estimating the term…
A second control device of a second substrate processing apparatus creates a virtual carrier, thereby storing a piece of positional information of a substrate to be carried into the second substrate processing apparatus through a direct carry-in entrance before the substrate is carried into the second substrate processing apparatus. The second control device creates a second schedule to convey a substrate carried into the second substrate processing apparatus through the direct carry-in entrance from the outside of the second substrate processing apparatus to the inside of the second substrate processing apparatus, based on the prestored positional information of the substrate outside the second substrate processing apparatus, before the substrate is carried into the second substrate processing apparatus.
A substrate processing apparatus having a control device that creates a job in accordance with a job creation command sent from a host computer and that controls the substrate processing apparatus to convey and/or process a substrate in a predetermined management area in the substrate processing apparatus based on the job;
A substrate processing method executed by a substrate processing apparatus,
Dependencies are inferred from the claim text.
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Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible…:…
Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to…
Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible…:…
Robotics, robotics mapping to robotics vision: stack and align identical layers, laminates, electronic substrate layers
About 8 years 6 months of term left · ends 23 Apr 2035 (estimated)
The present application is a 35 U.S.C. §§ 371 national phase conversion of PCT/JP2014/068467, filed Jul. 10, 2014, which claims priority to Japanese Patent Application No. 2013-156946, filed Jul. 29, 2013, the contents of both of which are incorporated herein by reference. The PCT International Application was published in the Japanese language.
The present invention relates to a substrate processing apparatus that processes substrates, relates to a substrate processing method, and relates to a substrate processing system. Examples of substrates to be processed include a semiconductor wafer, a substrate for use in liquid crystal display devices, a substrate for use in plasma displays, a substrate for use in FEDs (Field Emission Displays), a substrate for use in optical disks, a substrate for use in magnetic disks, a substrate for use in magnet-optical disks, a substrate for use in photomasks, a ceramic substrate, and a substrate for use in solar batteries.
In a process of manufacturing a semiconductor device or a liquid crystal display device, many steps that include two or more steps among a cleaning step, a heating step, a film forming step, an etching step, a resist applying step, an exposing step, and a developing step are performed for a substrate, such as a semiconductor wafer or a glass substrate that is used in a liquid crystal display device.
FIG. 1 is a schematic plan view of a substrate processing system 1 according to a preferred embodiment of the present invention.
FIG. 2 is a schematic side view showing an arrangement of the inside of a second substrate processing apparatus 4 according to the preferred embodiment of the present invention.
FIG. 3 is a schematic front view showing an arrangement of the inside of an intermediate apparatus 3 according to the preferred embodiment of the present invention.
FIG. 1 is a schematic plan view of a substrate processing system 1 according to a preferred embodiment of the present invention. FIG. 2 is a schematic side view showing an arrangement of the inside of a second substrate processing apparatus 4 according to the preferred embodiment of the present invention. FIG. 3 is a schematic front view showing an arrangement of the inside of an intermediate apparatus 3 according to the preferred embodiment of the present invention.
As shown in FIG. 1, the substrate processing system 1 includes a single substrate processing type first substrate processing apparatus 2 that processes substrates W one by one, a single substrate processing type second substrate processing apparatus 4 that processes substrates W one by one, an intermediate apparatus 3 that connects the first substrate processing apparatus 2 and the second substrate processing apparatus 4 together, and a carrier transfer robot 5 that transfers a carrier C (for example, FUOP) capable of containing a plurality of substrates W to the first substrate processing apparatus 2 and to the second substrate processing apparatus 4. The carrier C has its inner portion having a plurality of slots (shelves) disposed in the up-down direction with intervals therebetween. The carrier C is capable of supporting the substrates W by means of the slots such that the substrates Ware stacked together up and down with intervals therebetween in a horizontal posture.
The first substrate processing apparatus 2 may be any of a cleaning apparatus, a heat treatment apparatus, a film formation apparatus, an etching apparatus, a resist applying apparatus, an exposure apparatus, and a developing apparatus, or may be an apparatus that performs other processing operations with respect to the substrate W. The same applies to the second substrate processing apparatus 4. Additionally, the first substrate processing apparatus 2 and the second substrate processing apparatus 4 may be apparatuses that perform the same kind of processing operation with respect to the substrate W, or may be apparatuses that perform mutually-different kind of processing operations with respect to the substrate W. An example will be hereinafter described in which the first substrate processing apparatus 2 is a dry etching apparatus and in which the second substrate processing apparatus 4 is a wet cleaning apparatus that cleans a substrate W, which has undergone dry etching, by use of a cleaning solution, such as a chemical solution or a rinse solution.