Test system and method

A testing method comprising:

• coupling an independent test primitive to a device interface board (DIB),
• configuring the independent test primitive to control testing of a device under test (DUT) that is coupled to the device interface board, wherein the configuring includes loading a configuration firmware bit file to electronic test components that remain in the independent test primitive from one configuration to another;
• and
• directing testing of the device under test based upon independent testing control by the primitive.

A test system comprising:

• a plurality of device interface boards (DIBs) configured to interface with devices under test (DUTs);
• a plurality of independent primitives respectively coupled to the plurality of device interface boards, wherein the plurality of primitives is configured to control the respective plurality of device interface boards and testing of the respective devices under test, wherein at least one of the plurality of independent primitives is an independent self-contained test control unit comprising:
• a backplane interface configured to couple with the device interface board;
• a power supply component configured to control power to the backplane interface;
• and
• a site module of the primitive that controls testing signals sent to the device interface board and device under test;
• and
• a rack for mounting the plurality of independent primitives and plurality of device interface boards (DIBs).