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US 10,241,133 B2Granted
Probe tip and probe assembly
AssigneeTektronix, Inc.
InventorsJulie A. Campbell, William A. Hagerup, Ira G. Pollock, Christina D. Enns, James E. Spinar, Kathleen F. M. Ullom, Charles M. Hartmann, Daniel J. Ayres
Life of this patent
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Abstract
A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of the test probe tip without an insulating covering applied thereto. Additional embodiments may be described and/or claimed herein.
Claims16
A test probe tip, comprising:
- a resistive element having a structural member with a resistive layer applied to an exterior surface of the structural member, wherein the resistive layer is disposed lengthwise along the structural member to electrically couple a first end of the structural member with a second end of the structural member;
- and
- a tip component configured to be coupled with the first end of the resistive element, wherein the resistive element is configured to be coupled with the tip component such that the resistive element forms a structural component of the test probe tip without an insulating covering applied thereto, and wherein the resistive layer is configured to electrically couple the tip component with a test probe body.
A test probe, comprising:
- a test probe body configured to be coupled with a test and measurement device;
- and
- a test probe tip, coupled with the test probe body, configured to be coupled with a device under test, the test probe tip including:
- a resistive element having a structural member with a resistive layer applied to an exterior surface of, wherein the resistive layer is disposed lengthwise along the structural member to electrically couple a first end of the structural member with a second end of the structural member;
- and
- a tip component configured to be coupled with the first end of the resistive element such that the resistive element forms a structural component of the test probe tip without an insulating covering applied thereto, and wherein the resistive layer is configured to electrically couple the tip component with the test probe body.
3 more elements
Dependencies are inferred from the claim text.