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US 10,240,917 B2Granted
Measuring apparatus and measuring method
AssigneeKYOCERA Corporation
InventorsTomoya Yamada, Taku Matsudera
Life of this patent
Estimating the term…
Abstract
A measuring apparatus according to the present disclosure includes a support plate and an optical sensor. The support plate has an upper surface on a central portion of which an object is to be mounted, and is rotatable about an axis of rotation extending vertically from the central portion. The optical sensor is disposed above the support plate, and has a light-emitting element configured to irradiate the object with light and a light-receiving element configured to receive reflection light reflected from the object.
Claims8
A measuring apparatus, comprising:
- a support plate comprising an upper surface on a central portion of which an object is to be mounted, the support plate being rotatable about an axis of rotation extending vertically from the central portion;
- and
- an optical sensor secured to an end of a securing member which extends in a planar direction, the optical sensor disposed above and opposed to the support plate, the optical sensor comprising a light-emitting element configured to irradiate the object with light, a first light-receiving element configured to receive specular reflected light reflected from the object, and a second light-receiving element configured to receive diffuse reflected light reflected from the object,
- wherein the light-emitting element, the first light-receiving element, and the second light-receiving element are formed on a single substrate, and
- wherein the first light-receiving element is positioned on an opposite side of the light-emitting element than the second light-receiving element.
2 more elements
Dependencies are inferred from the claim text.