Back to results
US 10,240,915 B2Granted
Measurement system, measurement method, and vision chip
AssigneePanasonic Intellectual Property Corporation of America
InventorRyuji Fuchikami
Life of this patent
Estimating the term…
Abstract
A measurement system includes: a projection apparatus that projects, onto a subject, first pattern light indicating a first pattern projection image including a first pattern image corresponding to a specific bit in gray code obtained by gray-coding projection coordinates stipulated by a projection coordinate system, and a second pattern image having the same cycle as the first pattern image, but having a different phase from the first pattern image, following a projection sequence where projections of the first and second pattern images coexist; and at least one imaging apparatus that images the first pattern light and generates an imaged image.
Claims15
A measurement system comprising:
- a projection apparatus that projects, onto a subject, first pattern light indicating a first pattern projection image including a first pattern image corresponding to a specific bit in gray code obtained by gray-coding projection coordinates included in a projection coordinate system, and a second pattern image having a same cycle as the first pattern image, but having a different phase from the first pattern image, following a projection sequence where projections of the first and second pattern images coexist;
- and
- at least one imaging apparatus that images the first pattern light and generates an imaged image,
- wherein the first pattern image includes a plurality of first columns of pixels in an x-axis direction of the first pattern image,
- wherein the second pattern image includes a plurality of second columns of pixels in the x-axis direction of the second pattern image,
- wherein when the subject is stationary, the first pattern image including the plurality of first columns of pixels and the second pattern image including the plurality of second columns of pixels are projected on a same portion on the subject,
- wherein in the first pattern image,
- a (j+1)th first column of pixels to a (j+k)th first column of pixels are dark,
- a (j+1+k)th first column of pixels to a (j+2k)th first column of pixels are light,
- a (j+1+2k)th first column of pixels to a (j+3k)th first column of pixels are dark, and
- (j+1+3k)th first column of pixels to a (j+4k)th first column of pixels are light, where j is a whole number equal to or greater than zero, and k is whole number greater than zero, and
- wherein in the second pattern image,
- a (j+1+p)th second column of pixels to a (j+k+p)th second column of pixels are dark,
- a (j+1+k+p)th second column of pixels to a (j+2k+p)th second column of pixels are light,
- a (j+1+2k+p)th second column of pixels to a (j+3k+p)th second column of pixels are dark, and
- (j+1+3k+p)th second column of pixels to a (j+4k+p)th second column of pixels are light, where p is not equal to zero and is not equal to an integral multiple of k.
13 more elements
A measurement method used in a measurement system including a projection apparatus and an imaging apparatus, the method comprising:
- projecting, using the projecting apparatus, onto a subject to be measured, second pattern light indicating a first pattern projection image including a first pattern image corresponding to a specific bit in gray code obtained by gray-coding projection coordinates included in a projection coordinate system, and not including a second pattern projection image having a same cycle as the first pattern image, but having a different phase from the first pattern image, for one frame period or more, and thereafter projecting first pattern light indicating a first pattern projection image including the first and second pattern images on the subject for two frame periods or more;
- measuring second three-dimensional shape information indicating absolute distance to the subject, based on the imaged image of the second pattern light projected on the subject that has been imaged by the imaging apparatus;
- measuring first three-dimensional shape information indicating relative amount of change of the subject based on the imaged image of the first pattern light projected on the subject that has been imaged by the imaging apparatus;
- and
- updating the second three-dimensional shape information based on the first three-dimensional shape information,
- wherein the first pattern image includes a plurality of first columns of pixels in an x-axis direction of the first pattern image,
- wherein the second pattern image includes a plurality of second columns of pixels in the x-axis direction of the second pattern image,
- wherein when the subject is stationary, the first pattern image including the plurality of first columns of pixels and the second pattern image including the plurality of second columns of pixels are projected on a same portion on the subject,
- wherein in the first pattern image,
- a (j+1)th first column of pixels to a (j+k)th first column of pixels are dark,
- a (j+1+k)th first column of pixels to a (j+2k)th first column of pixels are light,
- a (j+1+2k)th first column of pixels to a (j+3k)th first column of pixels are dark, and
- (j+1+3k)th first column of pixels to a (j+4k)th first column of pixels are light,
- where j is a whole number equal to or greater than zero, and k is whole number greater than zero, and
- wherein in the second pattern image,
- a (j+1+p)th second column of pixels to a (j+k+p)th second column of pixels are dark,
- a (j+1+k+p)th second column of pixels to a (j+2k+p)th second column of pixels are light,
- a (j+1+2k+p)th second column of pixels to a (j+3k+p)th second column of pixels are dark, and
- (j+1+3k+p)th second column of pixels to a (j+4k+p)th second column of pixels are light, where p is not equal to zero and is not equal to an integral multiple of k.
16 more elements
Dependencies are inferred from the claim text.