Metrological apparatus and method for adjusting the attitude of a rotation-symmetrical workpiece

Method for adjusting an attitude of a rotation-symmetrical workpiece (16) having an arcuate upper surface (17) in a metrological apparatus (15) that comprises a workpiece support (23) that can be driven about a rotary axis (C), and that—via an adjustment assembly (24)—can be tilted relative to the rotary axis (C) and moved at a right angle relative to the rotary axis (C) in two spatial directions, wherein the metrological apparatus (15) comprises a sensor unit (18) configured to measure measuring points (xij, yij, zij, ci) in a machine coordinate system (KM) of the metrological apparatus (15) on an outside surface of the workpiece (16), the method comprising:

• S1:
• Measuring a first set of measuring points (x1j, y1j, z1j, c1) in a measuring plane (E) of the machine coordinate system (KM) on the upper surface (17) of the workpiece (16) in a first rotary position (c1) of the workpiece (16) about the rotary axis (C),
• S2:
• Rotating the workpiece support (23) with the workpiece (16) by an angle of rotation (δ) about the rotary axis (C) into a second rotary position (c2),
• S3:
• Measuring of a second set of measuring points (x2j, y2j, z2j, c2) in the same measuring plane (E) in the machine coordinate system (KM) on the upper surface (17) of the workpiece (16) in the second rotary position (c2) of the workpiece (16),
• S4:
• Determining a tilt angle (γ) and a shift (t) out of an actual attitude (Li) of the workpiece (16) described by the first and second sets of measuring points (xij, yij, zij, ci) into a target attitude (Ls) of the workpiece (16),
• S5:
• Activating the adjustment assembly (24) as a function of the tilt angle (γ) and the shift (t) in order to bring the actual attitude (Li) into coincidence with the target attitude (Ls).