Turn-secure rack
AssigneeBrooks Automation, Inc.
InventorsLars Weber-Hovendahl, Michael Gabs Kaagaard Nielsen
Life of this patent
Estimating the term…
Abstract
A SBS-standard test tube rack is provided which is suitable for use in automated capping and de-capping of flat bottomed test tubes, in particular flat bottomed glass vials, both for individual test tube capping and de-capping as well as simultaneous capping and de-capping of all test tubes in the aforementioned SBS-standard test tube rack. The rack comprises a top tier having a plurality of apertures and a bottom tier that comprises a friction tier of high friction material. The bottom of each well in the rack is formed of the high friction material.
Claims8
A test tube rack for receiving a test tube rack compliant screw-capped test tube of length (l) and diameter (d), said rack comprising:
- a top tier and a bottom tier, a top surface of said top tier and said bottom tier being, when the top tier and bottom tier are assembled to form said rack, spaced apart a distance smaller than said length (l);
- said top tier comprising a plurality of apertures of aperture diameter (da) larger than said diameter (d), said apertures arranged to form a 2-dimensional array of apertures in said top tier;
- said bottom tier comprising a friction tier and a support tier having independent wells, the friction tier comprising a sheet of high friction material closing the independent wells;
- said friction tier facing said top tier when said rack is assembled;
- wherein, when said rack is assembled, there is formed an array of rack wells, each rack well comprising an aperture of the plurality of apertures and a well bottom of well bottom diameter (dw) larger than said diameter (d), located opposite said aperture;
- and
- wherein when said rack is assembled, said well bottom is formed from said high friction material comprised in said friction tier.
A method of capping or de-capping a test tube rack compliant screw-capped test tube supported upright in a rack well comprising a well bottom in a test tube rack, the test tube rack comprising
- a top tier and a bottom tier, a top surface of said top tier and said bottom tier being, when the top tier and bottom tier are assembled to form said rack, spaced apart a distance smaller than said length (l),
- said top tier comprising a plurality of apertures of aperture diameter (da) larger than said diameter (d), said apertures arranged to form a 2-dimensional array of apertures in said top tier;
- said bottom tier comprising a friction tier and a support tier;
- said friction tier facing said top tier when said rack is assembled;
- said friction tier comprising a high friction material;
- wherein, when said rack is assembled, there is formed an array of rack wells, each rack well comprising an aperture of the plurality of apertures and a well bottom of well bottom diameter (dw) larger than said diameter (d), located opposite said aperture;
- and
- wherein when said rack is assembled, said well bottom is formed from said high friction material comprised in said friction tier;
- said rack positioned in an apparatus for automated test tube capping and de-capping opposite a capping and de-capping gripper comprised in said apparatus, said method comprising:
- engaging said gripper to said test tube and exerting a downwards force by said gripper on said test tube to create a frictional force between said test tube and said well bottom of said rack which exceeds a torsional force to cap or de-cap said test tube by rotation of said gripper in a direction for capping or de-capping said test tube, without said test tube co-rotating with said gripper in the direction of said gripper's rotation.
A test tube rack in combination with screw-capped test tubes, comprising:
- test tube rack compliant screw-capped test tubes, each of length (l) and diameter (d);
- and
- a test tube rack for receiving the test tube, the rack comprising
- a top tier and a bottom tier, a top surface of said top tier and said bottom tier being, when the top tier and bottom tier are assembled to form said rack, spaced apart a distance smaller than said length (l);
- said top tier comprising a plurality of apertures of aperture diameter (da) larger than said diameter (d), said apertures arranged to form a 2-dimensional array of apertures in said top tier;
- said bottom tier comprising a friction tier and a support tier;
- said friction tier facing said top tier when said rack is assembled;
- said friction tier comprising a high friction material;
- wherein, when said rack is assembled, there is formed an array of rack wells, each rack well comprising an aperture of the plurality of apertures and a well bottom of well bottom diameter (dw) larger than said diameter (d), located opposite said aperture;
- wherein when said rack is assembled, said well bottom is formed from said high friction material comprised in said friction tier;
- and
- wherein the screw-capped test tubes are positioned in the rack wells with bottom ends resting against the high friction material.
Dependencies are inferred from the claim text.