Device for analyzing the material composition of a sample via plasma spectrum analysis

A device for analyzing a material composition of an sample via plasma spectrum analysis, the device comprising:

• a laser assembly configured to emit a beam for plasma spectrum analysis;
• an optical assembly configured to direct the beam towards a target for plasma spectrum analysis of the target;
• a dispersion module;
• the optical assembly being configured to collect a plasma emitted light emitted from a plasma and provide the plasma emitted light to the dispersion module;
• the dispersion module includes a first diffraction grating configured such that plasma emitted light from the optical assembly is diffracted by the first diffraction grating;
• the dispersion module includes a second diffraction grating such that light diffracted by the first diffraction grating would also be diffracted by the second diffraction grating;
• and
• wherein the dispersion module is configured to transmit light out of the dispersion module after it has been diffracted by the first and second diffraction gratings;
• wherein the first diffraction grating and second diffraction grating are positioned within the dispersion module such that light received from the optical assembly contacts the first diffraction grating at least two times before being directed out of the dispersion module;
• and
• a housing, the housing substantially enclosing the laser assembly, the optical assembly, and the dispersion module.