Vertical field-effect transistor with uniform bottom spacer
AssigneeInternational Business Machines Corporation
InventorsJuntao Li, Kangguo Cheng, Peng Xu, Heng Wu
Life of this patent
Estimating the term…
Loading patent…
AssigneeInternational Business Machines Corporation
InventorsJuntao Li, Kangguo Cheng, Peng Xu, Heng Wu
Estimating the term…
A method of forming a semiconductor structure includes patterning two or more fins over a top surface of a bottom source/drain layer, the bottom source/drain layer disposed over a substrate. The method also includes forming bottom spacers disposed over the top surface of the bottom source/drain layer between the two or more fins, the bottom spacers having a uniform height on sidewalls of the two or more fins. The bottom spacers comprise dielectric regions disposed adjacent the sidewalls of the two or more fins and at least partially filling divots in the bottom source/drain regions, and liner regions disposed adjacent the dielectric regions. The two or more fins comprise channels for a vertical field-effect transistor (VFET) device.
A method of forming a semiconductor structure, comprising:
A semiconductor structure, comprising:
An integrated circuit comprising:
Dependencies are inferred from the claim text.