MEMS scan controlled keystone and distortion correction
AssigneeMicrovision, Inc.
InventorsJari Honkanen, Robert James Jackson, P. Selvan Viswanathan, Jonathan A. Morarity, David W. Armour
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AssigneeMicrovision, Inc.
InventorsJari Honkanen, Robert James Jackson, P. Selvan Viswanathan, Jonathan A. Morarity, David W. Armour
Estimating the term…
Briefly, in accordance with one or more embodiments, a MEMS scanned beam projector includes a light source to emit a light beam, a scanning platform to redirect the light beam impinging on the platform, and a display controller to control the light source and the scanning platform to cause the scanning platform to scan the light beam in a vertical direction and a horizontal direction in a scan pattern to project an image onto a projection surface. The display controller is configured to correct for image distortion in the projected image by providing a compensated drive signal to the scanning platform to compensate for the image distortion.
A MEMS scanned beam projector, comprising:
A MEMS scanned beam projector, comprising:
A method to compensate for image distortion in an image projected by a MEMS scanned beam projector, the method comprising:
A MEMS scanned beam projector, comprising:
Dependencies are inferred from the claim text.