Delay measurement circuit and measuring method thereof

A delay measurement circuit, comprising:

• a transporting path selector, coupled to a plurality of transporting conductive wires, selecting a first reference transporting conductive wire, a second reference transporting conductive wire and a tested transporting conductive wire in the transporting conductive wires, and forming a first transporting loop, a second transporting loop and a third transporting loop according to a control signal, wherein the first transporting loop passes through the first reference transporting conductive wire and the second reference transporting conductive wire, the second transporting loop passes through the first reference transporting conductive wire and the tested transporting conductive wire, and the third transporting loop passes through the second reference transporting conductive wire and the tested transporting conductive wire;
• a first delay measurement device, directly coupled to one end of the transporting path selector, and detecting transporting delays of the first transporting loop and the second transporting loop to respectively obtain the first transporting delays T0 and T2;
• a second delay measurement device, directly coupled to another end of the transporting path selector, and detecting transporting delays of the first transporting loop and the third transporting loop to respectively obtain the second transporting delays T1 and T3;
• and
• a controller, coupled to the transporting path selector, the first delay measurement device and the second delay measurement device, and generating the control signal,
• wherein the controller is configured to perform an arithmetic operation to obtain a transporting delay of the tested transporting conductive wire according to the first transporting delays T0 and T2 and the second transporting delays T1 and T3,
• wherein the transporting delay of the tested transporting conductive wire=(T2+T3−T4)/2, and T4 is an average of T0 and T1.