Testing device

A testing device, comprising:

• a testing platform;
• an electromagnetic relay platform arranged opposite to the testing platform;
• and
• a plurality of probe assemblies disposed between the electromagnetic relay platform and the testing platform, each of the probe assemblies comprising an electromagnetic base and a probe mounted in a side of the electromagnetic base away from the electromagnetic relay platform, wherein each of the electromagnetic bases is attracted together with the electromagnetic relay platform under an electromagnetic attraction force when the electromagnetic relay platform is energized;
• and when the electromagnetic relay platform is deenergized, the electromagnetic force is gone, then the probe assembly is detachable and movable from the electromagnetic relay platform, so as to redistribute positions of the probes,
• wherein, in each of the probe assemblies, the probe extends towards the testing platform, and the probe is configured to be telescopically moved in the electromagnetic base in the extension direction thereof.