Sensor arrangement for particle analysis and a method for particle analysis

A method for particle analysis, comprising:

• acquiring at least one electrical signal generated or modified by a sensor array in response to a solid particle at least one of approaching and adsorbed to the sensor array;
• determining a set of particle information based on the plurality of electrical signals, wherein the set of particle information comprises at least one of the following types of information:
• electrostatic charge information;
• particle size information;
• particle shape information;
• and/or
• particle material information;
• and
• comparing the set of particle information with a plurality of predefined particle characteristics each representing a particle sort so as to determine the presence of at least one particle sort.

A sensor arrangement for particle analysis, comprising:

• a sensor array configured to generate or modify at least one electrical signal in response to a solid particle at least one of approaching and adsorbed to the sensor array;
• a processing circuit configured to sense the at least one electrical signal and determine a set of particle information based on the at least one electrical signal, wherein the set of particle information comprises at least one of the following types of information:
• electrostatic charge information;
• particle size information;
• particle shape information;
• and/or
• particle material information;
• and
• wherein the processing circuit is configured for comparing the set of particle information with a plurality of predefined particle characteristics each representing a particle sort so as to determine the presence of at least one particle sort.