US 10,209,202 B1Granted

Optical characterization system for wide field of view diffractive optical elements

AssigneeFacebook Technologies, LLC

InventorsMark Timothy Sullivan, Andrew Matthew Bardagjy, Joseph Duggan, Fei Liu, Simon Morris Shand Weiss

Life of this patent

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Abstract

An optical characterization system includes a camera assembly and a workstation. The camera assembly is configured to capture images of different portions of a structured light pattern emitted from a device under test in accordance with imaging instructions. In some embodiments, the device under test may be a diffractive optical element (DOE). The workstation provides the imaging instructions to the camera assembly, and stitch the captured images together to form a pattern image. The pattern image is a single image of the entire structured light pattern. The workstation also characterizes performance of the device under test using the pattern image and a performance metric.

Claims22

Dependent claims

An optical characterization system comprising:

a camera assembly including a plurality of optical heads, the optical heads including a camera and an integrating sphere, the camera assembly configured to measure different portions of a structured light pattern in accordance with imaging instructions, the structured light pattern generated by a diffractive optical element (DOE) under test, and the structured light pattern having a field of view that is larger than a field of view of the camera assembly, and each measured different portion of the structured light pattern is captured at a same radial distance from a reference point on the DOE under test;
and
a workstation configured to:
provide the imaging instructions to the camera assembly, the imaging instructions causing the camera assembly to use the camera head to capture images of the different portions of the structured light pattern,
stitch the captured images together to form a pattern image, wherein the pattern image is a single image of the entire structured light pattern, and
characterize performance of the DOE under test using the pattern image and a performance metric.

3 more elements

Dependencies are inferred from the claim text.

Facts

Application: 15/623,162Filed 14 Jun 2017
Granted: 19 Feb 2019
Term ends: Not estimatedThe source records don’t support an estimate.

Classification15 codes

G01N 21/95
Investigating the presence of flaws or contamination: characterised by the material or shape of the object to be examined
G01N 21/8806
Investigating the presence of flaws or contamination: specially adapted optical and illumination features
G01N 21/8851
Investigating the presence of flaws or contamination: scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment,…
G06T 7/0006
Industrial image inspection: using a design-rule based approach