Spectrum measuring device, spectrum measuring method, and specimen container
AssigneeHamamatsu Photonics K.K.
InventorsKengo Suzuki, Kazuya Iguchi, Shigeru Eura, Kenichiro Ikemura
Life of this patent
Estimating the term…
Loading patent…
AssigneeHamamatsu Photonics K.K.
InventorsKengo Suzuki, Kazuya Iguchi, Shigeru Eura, Kenichiro Ikemura
Estimating the term…
A spectral measurement apparatus for irradiating a sample as a measurement object with excitation light and detecting light to be measured includes a light source generating the excitation light; an integrator having an input opening portion through which the excitation light is input, and an output opening portion from which the light to be measured is output; a housing portion arranged in the integrator and housing the sample; an incidence optical system making the excitation light incident to the sample; a photodetector detecting the light to be measured output from the output opening portion; and an analysis device calculating a quantum yield of the sample, based on a detection value detected by the photodetector, and the excitation light is applied to the sample so as to include the sample.
A spectral measurement apparatus for irradiating a sample as a measurement object with excitation light and detecting light to be measured, comprising:
A spectral measurement method for irradiating a sample as a measurement object with excitation light and detecting light to be measured, comprising:
Dependencies are inferred from the claim text.