Signal processing apparatus for eliminating object reflection noise in optical tomographic measurement

An optical tomographic measurement apparatus, comprising:

• an optical system configured to generate measurement light, reference light, and interference light between the reference light and return light of the measurement light from a measurement object;
• a detector configured to detect the interference light;
• a display screen;
• and
• a Central Processing Unit (CPU) configured to:
• calculate a signal intensity of simple reflection among the return light of the measurement light,
• wherein the simple reflection is one time of reflection at a plurality of layers, and
• wherein the plurality of layers are virtually set in a depth direction from a surface layer side of the measurement object;
• calculate a signal intensity of multiple reflection based on the signal intensity of the simple reflection,
• wherein the signal intensity of the multiple reflection is a signal intensity of the return light that is reflected at the plurality of layers at least three times;
• and
• control the display screen to display intensity distribution of the signal intensity of the simple reflection and the signal intensity of the multiple reflection.

A signal processing method comprising:

• calculating a signal intensity of simple reflection among return light of measurement light from a measurement object,
• wherein the simple reflection is one time of reflection at a plurality of layers virtually, and
• wherein the plurality of layers are set in a depth direction from a surface layer side of the measurement object;
• calculating a signal intensity of multiple reflection based on the signal intensity of the simple reflection,
• wherein the signal intensity of the multiple reflection is a signal intensity of the return light that is reflected at the plurality of layers at least three times;
• and
• controlling a display screen to display intensity distribution of the signal intensity of the simple reflection and the signal intensity of the multiple reflection.