Spectrometer with operator assistance for measurement optimization
AssigneeKaiser Optical Systems
InventorsDarren Schipper, Joseph B. Slater, James M. Tedesco
Life of this patent
Estimating the term…
Abstract
The present disclosure relates to assistive mechanisms and methods that aid an operator of a spectrometer to make spectral measurements of a sample, the measurements having a desired quality. The method enables quality spectral measurements quickly and simply, without a prior understanding of a sample's spectrum or of the details as to how the spectrum is measured. Data quality is improved, and the time required to collect the data is reduced. While a specific example of sample optic focus is disclosed in detail, the optimization of numerous other parameters is possible.
Claims20
A method of assisting an operator of a spectrometer to enhance the quality of a spectral measurement of a sample, the method comprising:
- providing a spectrometer including a probe and a detector having a dynamic range, wherein the spectrometer is controlled by a processor in communication with a display device;
- defining a regular update interval;
- performing a series of automatic, individual spectral measurements of a sample during the update interval;
- at the end of the update interval, calculating and displaying via the display device a measurement quality metric (MQM) based upon a combined spectral measurement of the sample taken during update interval using the processor;
- providing information to the operator enabling the operator to optimize the MQM;
- and
- repeating the series of individual spectral measurements, calculating and displaying the MQM, and providing information to the operator until a desired quality of the combined spectral measurement of the sample is achieved.
A spectroscopic system for enhancing the quality of a spectral measurement of a sample, the spectroscopic system comprising:
- a spectrometer having a detector in optical communication with a probe having a sample optic, wherein the spectrometer is adapted to measure signals from a sample;
- a display device;
- and
- a processor configured to control the spectrometer and the display device and to calculate a measurement quality metric (MQM), the processor further configured to develop a spectrum from the measured signals, to display the spectrum on the display device, to provide information to an operator of the spectrometer, enabling the operator to optimize the MQM until a desired quality of the combined spectral measurement of the sample is achieved.
Dependencies are inferred from the claim text.