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US 10,204,775 B2Granted
High pressure mass spectrometry systems and methods
Assignee908 Devices Inc.
InventorsChristopher D. Brown, Glenn A. Harris, Evgeny Krylov, Scott Miller
Life of this patent
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Abstract
Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
Claims26
A mass spectrometry system, comprising:
- an ion source;
- an ion trap;
- an ion detector;
- and
- an electronic processor connected to the ion source, the ion trap, and the ion detector, and configured to:
- determine a preferred ionization mode from among multiple ionization modes for sample particles in the mass spectrometry system based on measured ion currents corresponding to ions generated according to each of the ionization modes;
- generate ions from the sample particles according to the preferred ionization mode and acquire a first set of mass spectral information for the sample particles at a first measurement resolution;
- determine information about types of particles in the sample particles based on the first set of mass spectral information;
- adjust an operating mode of the system based on the information about the types of particles;
- and
- acquire a second set of mass spectral information for the sample particles according to the adjusted operating mode of the system, at a second measurement resolution higher than the first measurement resolution.
8 more elements
A method, comprising:
- determining a preferred ionization mode from among multiple ionization modes for sample particles in a mass spectrometry system based on measured ion currents corresponding to ions generated according to each of the ionization modes;
- generating ions from the sample particles according to the preferred ionization mode and acquiring a first set of mass spectral information for the sample particles at a first measurement resolution;
- determining information about types of particles in the sample particles based on the first set of mass spectral information;
- adjusting an operating mode of the system based on the information about the types of particles;
- and
- acquiring a second set of mass spectral information for the sample particles according to the adjusted operating mode of the system, at a second measurement resolution higher than the first measurement resolution.
3 more elements
Dependencies are inferred from the claim text.