Scanning infrared measurement system
Assignee1087 Systems, Inc.
InventorMatthias Wagner
Life of this patent
Estimating the term…
Abstract
An analyzer of a component in a sample fluid includes an optical source and an optical detector defining a beam path of a beam, wherein the optical source emits the beam and the optical detector measures the beam after partial absorption by the sample fluid, a fluid flow cell disposed on the beam path defining an interrogation region in the a fluid flow cell in which the optical beam interacts with the sample fluid and a reference fluid; and wherein the sample fluid and the reference fluid are in laminar flow, and a scanning system that scans the beam relative to the laminar flow within the fluid flow cell, wherein the scanning system scans the beam relative to both the sample fluid and the reference fluid.
Claims34
An analyzer of a component, comprising:
- an optical source configured to emit a first light;
- a scanning system configured to scan the first light over the component in liquid and a reference liquid flowing in parallel with the component in liquid in a flow chamber;
- wherein the scanning system scans across an interface between the parallel flows;
- wherein the parallel flows are at nearly identical pressure;
- an optical detector subsystem configured to measure a second light after interaction with the component in liquid and the reference liquid;
- and
- a guiding system configured to guide the first light from the optical source to the component in liquid and the reference liquid and to guide the second light from the component in liquid and the reference liquid to the optical detector subsystem.
Dependencies are inferred from the claim text.