Optical sectioning apparatus using advanced optical interference microscopy

An optical sectioning apparatus using optical interference microscopy and fluorescence microscopy, including:

• a beam splitter, having a first side, a second side, a third side, and a fourth side, and being capable of splitting an incident light beam received from the first side into a reflected light beam traveling out the second side and a transmitted light beam traveling out the third side;
• a wide band light source apparatus for generating a wide band light beam to be incident on the first side of the beam splitter;
• a reference arm unit, used to make the transmitted light beam travel a round trip along an adjustable optical path and then return to the beam splitter;
• a short wavelength light source apparatus for generating a short wavelength light beam;
• a first dichroic splitter, having a first side, a second side, and a third side, with the first side facing the short wavelength light source apparatus, the third side facing the second side of the beam splitter, and being capable of providing a light-blocking effect on a band of wavelengths shorter than a preset wavelength, and the short wavelength light beam having a wavelength shorter than the preset wavelength;
• a first objective lens, having a collimated side and a focal side, with the collimated side facing the second side of the first dichroic splitter;
• a sample carrier unit facing the focal side of the first objective lens and being used for carrying a sample stained with a fluorescent dye;
• a projection lens, having a light entrance side and a light exit side, with the light entrance side facing the fourth side of the beam splitter;
• and
• a sensor unit facing the light exit side of the projection lens.