Increasing the resolution of on-chip measurement circuits
AssigneesInternational Business Machines Corporation, Computer Task Group, Inc.
InventorsRobert L. Franch, Phillip J. Restle, Thomas Strach, Christos Vezyrtzis, Scott F. Warnock
Life of this patent
Estimating the term…
Abstract
A method for increasing a resolution of an on-chip measurement circuit is provided. The method includes propagating a first signal through the on-chip measurement circuit to generate a first output. The method also includes propagating a second signal through the on-chip measurement circuit to generate a second output. The second signal includes a delay. The method also includes reconciling the first output and the second output to determine the resolution of the on-chip measurement circuit. The resolution of the on-chip measurement circuit increases in correspondence with a fineness of a step of the delay.
Claims16
A method for increasing a resolution of an on-chip measurement circuit comprising a first circuit and a circuit delay chain comprising a plurality of stages, the method comprising:
- propagating, by the first circuit of the on-chip measurement circuit, a first signal through the circuit delay chain of the on-chip measurement circuit to generate a first output;
- propagating, by the first circuit of the on-chip measurement circuit, a second signal through the circuit delay chain of the on-chip measurement circuit to generate a second output, wherein the second signal includes a delay;
- and
- reconciling the first output and the second output to determine the resolution of the on-chip measurement circuit by a comparison of the first output and the second output at each stage of the plurality of stages within the on-chip measurement circuit to identify at each stage whether an original transition or a delay transition of the first and second signals occurred,
- wherein the resolution of the on-chip measurement circuit increases in correspondence with the delay.
A system for increasing a resolution of an on-chip measurement circuit, the system comprising the on-chip measurement circuit, the on-chip measurement circuit comprising a first circuit and a circuit delay chain comprising a plurality of stages, the system being configured to:
- propagate, by the first circuit, a first signal through the on-chip measurement circuit to generate a first output;
- propagate, by the first circuit, a second signal through the on-chip measurement circuit to generate a second output, wherein the second signal includes a delay;
- and
- reconcile the first output and the second output to determine the resolution of the on-chip measurement circuit by a comparison of the first output and the second output at each stage of the plurality of stages within the on-chip measurement circuit to identify at each stage whether an original transition or a delay transition of the first and second signals occurred,
- wherein the resolution of the on-chip measurement circuit increases in correspondence with the delay.
An on-chip measurement circuit comprising:
- a circuit delay chain comprising a plurality of stages, the circuit delay chain being configured to receive and propagate a plurality of signals to execute a measurement;
- and
- a programmable device configured to provide the plurality of signals to the circuit delay chain,
- wherein the programmable device implements a delay in at least one of the plurality of signals to increase a resolution of the measurement of the circuit delay chain,
- wherein the on-chip measurement circuit reconciles the first output and the second output to determine the resolution of the on-chip measurement circuit by a comparison of the first output and the second output at each stage of the plurality of stages within the on-chip measurement circuit to identify at each stage whether an original transition or a delay transition of the first and second signals occurred,
- wherein the first and second outputs respectively correspond to first and second signals,
- wherein the resolution of the on-chip measurement circuit increases in correspondence with the delay.
Dependencies are inferred from the claim text.