Tri-mode probe with automatic skew adjustment
AssigneeTektronix, Inc.
InventorsDaniel G. Knierim, Christopher R. Muggli, Martin Rockwell, Ira G. Pollock
Life of this patent
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Abstract
A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal, and an amplifier configured to receive the first input signal from the electronically adjustable delay and a second input signal.
Claims14
A probe comprising:
- a first input configured to receive a first input signal, the first input signal being a first of a pair of input signals forming a differential signal from a device under test;
- a second input configured to receive a second input signal, the second input signal being a second of the pair of input signals forming the differential signal from the device under test;
- a broadband electronically adjustable delay DC-coupled to the first input, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal;
- an amplifier configured to receive the first input signal from the electronically adjustable delay and the second input signal;
- an output configured to provide an output signal to a single input channel of a test and measurement instrument;
- and
- a processor connected to the broadband electronically adjustable delay, the processor configured to determine a delay adjustment amount by using a reference signal with a defined timing relationship as a standard against which to compare the differential signal.
A method for correcting skew in a test and measurement probe between a first input signal and a second input signal, the method comprising:
- receiving the first input signal, the first input signal being a first of a pair of input signals forming a differential signal from a device under test;
- receiving the second input signal, the second input signal being a second of the pair of input signals forming the differential signal from the device under test;
- determining an amount of skew between the first input signal and the second input signal by using a reference signal with a defined timing relationship as a standard against which to compare the differential signal;
- and
- adjusting a delay of at least one broadband DC-coupled electronically variable adjustable delay based on the amount of skew between the first input signal and the second input signal to remove the skew between the first input signal and the second input signal.
Dependencies are inferred from the claim text.