Quasi-planar multi-reflecting time-of-flight mass spectrometer

A method of time-of-flight analysis comprising the steps of:

• forming packets of analyzed ions;
• passing ion packets between two parallel and quasi-planar ion mirrors extended along a drift Z-direction while retaining relatively small velocity component of the ion packets along the Z-direction such that the ion packets move along a jigsaw ion trajectory;
• receiving ions at a receiver;
• focusing the ion packets in time and spatially focused in direction Y;
• spatially and periodically modulating an electrostatic field within at least one mirror in order to provide for spatial focusing of the ion packets along the Z-direction;
• applying an end potential to an end of a single mask window electrode disposed between the two ion mirrors;
• and
• applying a main potential to a center of the mask window, wherein the end potential is different than the main potential to produce a deflecting field at the end of the mask window.

A method of time-of-flight analysis comprising the steps of:

• forming packets of analyzed ions;
• passing ion packets between two parallel and quasi-planar ion mirrors extended along a drift Z-direction while retaining relatively small velocity component of the ion packets along the Z-direction such that the ion packets move along a jigsaw ion trajectory;
• receiving ions at a receiver;
• focusing the ion packets in time and spatially focused in direction Y;
• spatially and periodically modulating an electrostatic field within at least one mirror in order to provide for spatial focusing of the ion packets along the Z-direction by a periodic feature, the periodic feature comprising at least one of the following:
• at least one mirror electrode with an opening varying in height in the Y-direction;
• at least one mirror electrode with varying width along an X-direction;
• or
• a set of periodic lenses incorporated into an internal electrode of at least one of said mirrors.