# US 10,121,904 B2 · Semiconductor device

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- Number: US 10,121,904 B2
- Document ID: US10121904B2
- Status: Granted
- Kind: B2
- Application number: 15/678,180
- Filed: 2017-08-16
- Published: 2018-01-25
- Granted: 2018-11-06
- Earliest claimed: 2009-11-20
- Assignees: Semiconductor Energy Laboratory Co., Ltd.
- Applicants: Semiconductor Energy Laboratory Co., Ltd.
- Inventors: Kiyoshi Kato; Jun Koyama
- Web page: https://patentgrep.com/patent/US10121904B2

## CPC

- H10D 30/6757: {characterised by the structure of the channel, e.g. transverse or longitudinal shape or doping profile (TFTs having channel structures for preventing kink or snapback effects H10D30/6708; TFTs having lightly-doped source or drain extensions H10D30/6715)}
- G06K 19/07749: {the record carrier being capable of non-contact communication, e.g. constructional details of the antenna of a non-contact smart card}
- G06K 19/07773: {Antenna details (antennas for wireless devices, e.g. RFID tags, in general H01Q1/22)}
- H04B 1/40: Circuits
- H10D 30/6755: {Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate}
- H10D 62/235: {of IGFETs (IGFETs having buried channels H10D30/637)}
- H10D 86/423: {comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO}
- H10D 86/60: wherein the TFTs are in active matrices
- H10D 88/00: Three-dimensional [3D] integrated devices
- H10W 44/20: at high-frequency [HF] or radio frequency [RF]
- H10W 44/248: {for antennas}
- Y02D 30/70: in wireless communication networks
- Y02E 60/10: Energy storage using batteries
- H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- G06K: GRAPHICAL DATA READING (image or video recognition or understanding G06V); PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- H04B: TRANSMISSION
- H10W: GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- Y02D: CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02E: REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION

## Abstract

An object is to achieve low power consumption and a long lifetime of a semiconductor device having a wireless communication function. The object can be achieved in such a manner that a battery serving as a power supply source and a specific circuit are electrically connected to each other through a transistor in which a channel formation region is formed using an oxide semiconductor. The hydrogen concentration of the oxide semiconductor is lower than or equal to 5×1019 (atoms/cm3). Therefore, leakage current of the transistor can be reduced. As a result, power consumption of the semiconductor device in a standby state can be reduced. Further, the semiconductor device can have a long lifetime.

## Claims

### Claim 1

A semiconductor device comprising:
a secondary battery configured to be charged by wireless communication through a first circuit, the first circuit configured to rectify a signal input by the wireless communication;
a second circuit electrically connected to the secondary battery, the second circuit comprising a transistor, the transistor comprising a channel formation region comprising an oxide semiconductor;
a third circuit comprising a plurality of n-channel transistors;
a fourth circuit electrically connected to the second circuit;
wherein a first signal is input to the fourth circuit from the second circuit,
wherein a second signal is input to the transistor from the fourth circuit, and
wherein the transistor is provided between the first and the third circuits.

### Claim 2 (depends on 1)

The semiconductor device according to claim 1, wherein the third circuit is configured to perform operation in a period when the transistor is in an on state.

### Claim 3 (depends on 1)

The semiconductor device according to claim 1, wherein the plurality of n-channel transistors have different structures.

### Claim 4 (depends on 1)

The semiconductor device according to claim 1, wherein a hydrogen concentration in the channel formation region of the transistor is lower than or equal to 5×1019 atoms/cm3.

### Claim 5 (depends on 1)

The semiconductor device according to claim 1, wherein the oxide semiconductor comprises indium and zinc.

### Claim 6 (depends on 1)

The semiconductor device according to claim 1, further comprising a gate electrode comprising copper,
wherein the gate electrode and the channel formation region of the transistor overlap each other.

### Claim 7

A semiconductor device comprising:
a secondary battery configured to be charged by wireless communication through a first circuit, the first circuit configured to rectify a signal input by the wireless communication;
a second circuit electrically connected to the secondary battery, the second circuit comprising a transistor, the transistor comprising a channel formation region comprising an oxide semiconductor;
a third circuit comprising a plurality of n-channel transistors;
a fourth circuit electrically connected to the second circuit;
wherein a first signal is input to the fourth circuit from the second circuit,
wherein a second signal is input to the transistor from the fourth circuit, and
wherein the transistor is provided between the first and the third circuits.

### Claim 8 (depends on 7)

The semiconductor device according to claim 7, wherein the third circuit is configured to perform operation in a period when the transistor is in an on state.

### Claim 9 (depends on 7)

The semiconductor device according to claim 7, wherein a hydrogen concentration in the channel formation region of the transistor is lower than or equal to 5×1019 atoms/cm3.

### Claim 10 (depends on 7)

The semiconductor device according to claim 7, wherein the oxide semiconductor comprises indium and zinc.

### Claim 11 (depends on 7)

The semiconductor device according to claim 7, further comprising a gate electrode comprising copper,
wherein the gate electrode and the channel formation region of the transistor overlap each other.

### Claim 12

A semiconductor device comprising:
a secondary battery configured to be charged by wireless communication through a first circuit, the first circuit configured to rectify a signal input by the wireless communication;
a second circuit electrically connected to the secondary battery, the second circuit comprising a transistor, the transistor comprising a channel formation region comprising an oxide semiconductor;
a third circuit comprising a logic gate;
a fourth circuit electrically connected to the second circuit;
wherein a first signal is input to the fourth circuit from the second circuit,
wherein a second signal is input to the transistor from the fourth circuit, and
wherein the transistor is provided between the first and the third circuits.

### Claim 13 (depends on 12)

The semiconductor device according to claim 12, wherein the third circuit is configured to perform operation in a period when the transistor is in an on state.

### Claim 14 (depends on 12)

The semiconductor device according to claim 12, wherein a hydrogen concentration in the channel formation region of the transistor is lower than or equal to 5×1019 atoms/cm3.

### Claim 15 (depends on 12)

The semiconductor device according to claim 12, wherein the oxide semiconductor comprises indium and zinc.

### Claim 16 (depends on 12)

The semiconductor device according to claim 12, further comprising a gate electrode comprising copper,
wherein the gate electrode and the channel formation region of the transistor overlap each other.
