# US 10,121,632 B2 · Charged particle beam apparatus > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,121,632 B2 - Document ID: US10121632B2 - Status: Granted - Kind: B2 - Application number: 15/487,561 - Filed: 2017-04-14 - Published: 2017-11-02 - Granted: 2018-11-06 - Earliest claimed: 2016-04-28 - Assignees: Hitachi High-Technologies Corporation - Applicants: Hitachi High-Technologies Corporation - Inventors: Nobuhiro Okai; Natsuki Tsuno; Naomasa Suzuki; Tomoyasu Shojo - Web page: https://patentgrep.com/patent/US10121632B2 ## CPC - H01J 37/244: Detectors; Associated components or circuits therefor - H01J 37/14: magnetic - H01J 37/20: Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support - H01J 37/28: with scanning beams {(H01J37/268, H01J37/292, H01J37/2955 take precedence)} - H01J 2237/10: Lenses - H01J 2237/2448: Secondary particle detectors - H01J 2237/2449: Detector devices with moving charges in electric or magnetic fields - H01J 2237/24495: Signal processing, e.g. mixing of two or more signals - H01J 2237/2809: characterised by the imaging problems involved - H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H) ## Abstract Provided is a charged particle beam apparatus which includes a charged particle source, a sample table on which a sample is placed, a charged particle beam optical system that includes an objective lens and emits a charged particle beam emitted from the charged particle source onto the sample, a plurality of detectors which detect secondary particles emitted from the sample when being irradiated with the charged particle beam, and a rotation member which magnetically, electrically, or mechanically changes a detected azimuth angle of the secondary particles emitted from the sample. ## Claims ### Claim 1 A charged particle beam apparatus, comprising: a charged particle source; a sample table on which a sample is placed; a charged particle beam optical system that includes an objective lens, and focuses charged particles emitted from the charged particle source onto the sample as a charged particle beam; a plurality of detectors that detect secondary particles emitted from the sample; a rotation member that magnetically, electrically, or mechanically changes a detected azimuth angle of the secondary particles in the detectors; and an electrode that is disposed between the plurality of detectors to operate in an azimuth angle direction of the secondary particles. ### Claim 2 (depends on 1) The charged particle beam apparatus according to claim 1, wherein the rotation member is a member that magnetically changes the detected azimuth angle, and includes a coil disposed between the objective lens and the plurality of detectors. ### Claim 3 (depends on 2) The charged particle beam apparatus according to claim 2, further comprising: a magnetic pole that contains the coil, and includes a gap in a direction of an optical axis of the charged particle beam. ### Claim 4 (depends on 2) The charged particle beam apparatus according to claim 2, further comprising: a magnetic shield that is disposed between an optical axis of the charged particle beam and the coil. ### Claim 5 (depends on 1) The charged particle beam apparatus according to claim 1, wherein the plurality of detectors are disposed symmetrically to an optical axis of the charged particle beam. ### Claim 6 (depends on 1) The charged particle beam apparatus according to claim 1, wherein the objective lens includes an upper magnetic pole and a lower magnetic pole, and wherein the upper magnetic pole serves also as an electrode that accelerates the secondary particles emitted from the sample in a direction toward the plurality of detectors. ### Claim 7 (depends on 1) The charged particle beam apparatus according to claim 1, further comprising: a reflection electrode that is disposed between the optical axis and the plurality of detectors to generate new secondary particles when the secondary particles come into conflict. ### Claim 8 (depends on 1) The charged particle beam apparatus according to claim 1, wherein the rotation member is a member that mechanically changes the detected azimuth angle, and is a member that mechanically rotates the plurality of detectors or a member that mechanically rotates the sample table. ### Claim 9 (depends on 1) The charged particle beam apparatus according to claim 1, wherein the plurality of detectors form an annular detector that is divided into plural pieces. ### Claim 10 A charged particle beam apparatus, comprising: a charged particle source; a sample table on which a sample is placed; a charged particle beam optical system that includes an objective lens, and focuses charged particles emitted from the charged particle source onto the sample as a charged particle beam; a plurality of detectors that detect secondary particles emitted from the sample; and a rotation member that magnetically, electrically, or mechanically changes a detected azimuth angle of the secondary particles in the detectors; wherein the rotation member is a member that electrically changes the detected azimuth angle, and is a rotation control electrode that is disposed between the objective lens and the plurality of detectors. ### Claim 11 (depends on 10) The charged particle beam apparatus according to claim 10, wherein the rotation control electrode is a meshed electrode, the charged particle beam apparatus, further comprising: an electric shield that is disposed between the optical axis and the meshed electrode. ### Claim 12 A charged particle beam apparatus, comprising: a charged particle source; a sample table on which a sample is placed; a charged particle beam optical system that focuses charged particles emitted from the charged particle source onto the sample as a charged particle beam; a plurality of detectors that are disposed at positions symmetrically to an optical axis of the charged particle beam, and detect secondary particles emitted from the sample when being irradiated with the charged particle beam; a rotation member that changes a detected azimuth angle of the secondary particles in the detectors; and a controller that is connected to a monitor to display a rotation angle of the azimuth angle of the secondary particles, and controls components of the charged particle beam apparatus; and an electrode that is disposed between the plurality of detectors to operate in an azimuth angle direction of the secondary particles. ### Claim 13 (depends on 12) The charged particle beam apparatus according to claim 12, further comprising: a control table that is connected to the controller, and stores data to control the rotation member on the basis of the rotation angle designated from the monitor.