# US 10,121,631 B2 · Charged particle beam device provided with ion pump > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,121,631 B2 - Document ID: US10121631B2 - Status: Granted - Kind: B2 - Application number: 15/570,803 - Filed: 2015-05-01 - Published: 2018-06-07 - Granted: 2018-11-06 - Earliest claimed: 2015-05-01 - Assignees: Hitachi High-Technologies Corporation - Applicants: Hitachi High-Technologies Corporation - Inventors: Masazumi Tone; Hiroshi Touda; Fujio Onishi - Web page: https://patentgrep.com/patent/US10121631B2 ## CPC - H01J 37/241: {High voltage power supply or regulation circuits} - H01J 37/08: Ion sources; Ion guns - H01J 37/18: Vacuum locks {; Means for obtaining or maintaining the desired pressure within the vessel} - H01J 37/222: {Image processing arrangements associated with the tube} - H01J 37/24: Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for - H01J 37/244: Detectors; Associated components or circuits therefor - H01J 37/248: Components associated with high voltage supply - H01J 37/26: Electron or ion microscopes; Electron or ion diffraction tubes - H01J 37/28: with scanning beams {(H01J37/268, H01J37/292, H01J37/2955 take precedence)} - H01J 2237/1825: Evacuating means - H01J 2237/2448: Secondary particle detectors - H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H) ## Abstract In a charged particle apparatus with an ion pump, which is a charged particle beam apparatus with an ion pump including a charged particle beam irradiation detecting unit for irradiating a sample with a charged particle beam in a chamber and detecting a secondary charged particle, an image processing unit for forming a secondary charged particle image from a detection signal of the detected secondary charged particle, an output unit for processing at the image processing unit and outputting an image, an ion pump for maintaining the interior of the processing chamber in a vacuum state, a driving power supply unit of the ion pump, and a high voltage cable for connecting the ion pump and the driving power supply unit, the driving power supply unit of the ion pump is structured to include a high voltage power supply circuit unit for operating the ion pump, a load current detection circuit unit for detecting a load current applied to the ion pump, and a canceller circuit unit for reducing low frequency noise applied to the load current detection circuit unit in order to sufficiently reduce low frequency noise of the power supply of the ion and to measure the degree of vacuum with a high accuracy. ## Claims ### Claim 1 A charged particle apparatus with an ion pump, which is a charged particle beam apparatus with an ion pump comprising: a charged particle beam irradiation detecting unit which irradiates a sample with a charged particle beam converged in a processing chamber and detecting a secondary charged particle generated from the sample, an image processing unit which processes a detection signal of the secondary charged particle detected by the charged particle beam irradiation detecting unit and forms a secondary charged particle image of the sample, an output unit which performs processing at the image processing unit and outputs an image, an ion pump which maintains an interior of the processing chamber in a vacuum state, a driving power supply unit of the ion pump, and a high voltage cable which connects the ion pump and the driving power supply unit, wherein the driving power supply unit of the ion pump includes: a high voltage power supply circuit unit which operates the ion pump, a load current detection circuit unit which detects a load current applied to the ion pump, and a canceller circuit unit which reduces low frequency noise applied to the load current detection circuit unit. ### Claim 2 (depends on 1) The charged particle apparatus with an ion pump according to claim 1, wherein the high voltage power supply circuit unit of the driving power supply unit of the ion pump includes a transformer which has an MOS transistor at the primary side, an AC-DC converting unit which supplies a DC voltage to the primary side of the transformer, a pulse generating unit which supplies a voltage pulse to a gate of the MOS transistor at the primary side of the transformer, an output voltage detection circuit which detects an output voltage at the secondary side of the transformer, and a control unit which determines a voltage pulse width from the output voltage detected by the output voltage detection circuit. ### Claim 3 (depends on 1) The charged particle apparatus with an ion pump according to claim 1, wherein the high voltage cable has a high voltage signal line and a GND line, and the canceller circuit unit reduces the low frequency noise sneaking to the load current detection circuit via a capacitance formed between the high voltage signal line and the GND line of the high voltage cable. ### Claim 4 (depends on 3) The charged particle apparatus with an ion pump according to claim 3, wherein the canceller circuit unit includes a capacitance equal to the capacitance formed between the high voltage signal line and the GND line of the high voltage cable, a current voltage conversion circuit, an inverting amplifier and an adding circuit. ### Claim 5 (depends on 3) The charged particle apparatus with an ion pump according to claim 3, wherein the canceller circuit unit includes a capacitance equal to the capacitance formed between the high voltage signal line and the GND line of the high voltage cable, a current voltage conversion circuit, an inverting amplifier and a differential amplifier. ### Claim 6 (depends on 4) The charged particle apparatus which is an ion pump power supply for the charged particle apparatus according to claim 4, wherein, in an ion pump power supply for the charged particle beam apparatus, the canceller circuit unit further includes an amplitude control unit, the inverting amplifier of the canceller circuit unit has a variable resistor, and the amplitude control unit determines a resistance value of the variable resistor of the inverting amplifier such that the low frequency noise remaining in the load current detection circuit unit is minimized. ### Claim 7 A charged particle apparatus with an ion pump, which is a charged particle beam apparatus with an ion pump comprising: an electron microscope which has a lens barrel, an ion pump which maintains an interior of the lens barrel of the electron microscope in a vacuum state, and a driving power supply unit of the ion pump, wherein the driving power supply unit of the ion pump includes a high voltage power supply circuit unit which operates the ion pump, a load current detection circuit unit which detects a load current applied to the ion pump, and a canceller circuit unit which reduces low frequency noise applied to the load current detection circuit unit. ### Claim 8 (depends on 7) The charged particle apparatus with an ion pump according to claim 7, wherein the high voltage power supply circuit unit of the driving power supply unit of the ion pump includes a transformer which has an MOS transistor at the primary side, an AC-DC converting unit which supplies a DC voltage to the primary side of the transformer, a pulse generating unit which supplies a voltage pulse to a gate of the MOS transistor at the primary side of the transformer, an output voltage detection circuit for detecting an output voltage at the secondary side of the transformer, and a control unit which determines a voltage pulse width from the output voltage detected by the output voltage detection circuit. ### Claim 9 (depends on 7) The charged particle apparatus with an ion pump according to claim 7, wherein the charged particle apparatus with an ion pump further comprises a high voltage cable which connects the ion pump and the driving power supply unit, the high voltage cable having a high voltage signal line and a GND line, and the canceller circuit unit reduces the low frequency noise sneaking to the load current detection circuit via a capacitance formed between the high voltage signal line and the GND line of the high voltage cable. ### Claim 10 (depends on 9) The charged particle apparatus with an ion pump according to claim 9, wherein the canceller circuit unit includes a capacitance equal to the capacitance formed between the high voltage signal line and the GND line of the high voltage cable, a current voltage conversion circuit, an inverting amplifier and an adding circuit. ### Claim 11 (depends on 9) The charged particle apparatus with an ion pump according to claim 9, wherein the canceller circuit unit includes a capacitance equal to the capacitance formed between the high voltage signal line and the GND line of the high voltage cable, a current voltage conversion circuit, an inverting amplifier and a differential amplifier. ### Claim 12 (depends on 11) The charged particle apparatus which is an ion pump power supply for the charged particle apparatus according to claim 11, wherein, in an ion pump power supply for the charged particle beam apparatus, the canceller circuit unit further includes an amplitude control unit, the inverting amplifier of the canceller circuit unit has a variable resistor, and the amplitude control unit determines a resistance value of the variable resistor of the inverting amplifier such that the low frequency noise remaining in the load current detection circuit unit is minimized.