# US 10,120,966 B2 · Information processing device and waveform verification method > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,120,966 B2 - Document ID: US10120966B2 - Status: Granted - Kind: B2 - Application number: 15/087,091 - Filed: 2016-03-31 - Published: 2016-11-17 - Granted: 2018-11-06 - Earliest claimed: 2015-05-14 - Assignees: Fujitsu Limited - Applicants: Fujitsu Limited - Inventors: Hikoyuki Kawata; Masaki Tosaka; Kumiko Teramae - Web page: https://patentgrep.com/patent/US10120966B2 ## CPC - G06F 30/367: Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods - G06F 2119/10: Noise analysis or noise optimisation - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) ## Abstract An information processing device include: a memory; and one or more processors which are coupled to the memory, wherein the one or more processors performs a process including verifying a quality of a signal waveform that is propagated through focused wiring on a substrate; and storing information which is used for the verification of the quality of the signal waveform, and wherein the verifying includes determining a relative permittivity of the substrate in a division position of a variation range of the relative permittivity of the substrate such that a variation range of a propagation delay time of the signal waveform corresponding to the variation range of the relative permittivity of the substrate is divided at even intervals; generating an analysis model corresponding to the relative permittivity of the substrate in the determined division position; and performing waveform analysis on the signal waveform using the generated analysis model. ## Claims ### Claim 1 A non-transitory, computer-readable recording medium which stores a waveform verification program that causes a memory and one or more processors, which are coupled to the memory and configured to verify a quality of a signal waveform that is propagated through focused wiring on a substrate, to perform a process comprising: determining a relative permittivity of the substrate in a division position of a variation range of the relative permittivity of the substrate such that a variation range of a propagation delay time of the signal waveform corresponding to the variation range of the relative permittivity of the substrate is divided at even intervals; generating an analysis model corresponding to the relative permittivity of the substrate in the determined division position; performing waveform analysis on the signal waveform using the generated analysis model; and generating an eye pattern according to the waveform analysis performed on the signal waveform for each analysis model. ### Claim 2 (depends on 1) The computer-readable recording medium which stores a waveform verification program according to claim 1, wherein, if it is assumed that the relative permittivity of the substrate in an n-th (n is an integer which is equal to or greater than 0) division position is ∈r(n), the waveform verification program causes the computer to perform a process including respectively determining the relative permittivities ∈r(0) and ∈r(n+1) of the substrate in 0-th and (n+1)-th division positions by equations ∈r(0)=∈r_min and ɛ ⁢ ⁢ r ⁡ ( n + 1 ) = ( UI N × L ⁢ μ 0 ⁢ ɛ 0 + ɛ ⁢ ⁢ r ⁡ ( n ) ) 2 , where, ∈r_min is a minimum value of the variation range of the relative permittivity of the substrate, L is a wiring length of the focused wiring, a Unit Interval (UI) is a time of one bit length of a data signal (inverse number of a bit rate), N is the number of divisions performed on bits in a case of the waveform analysis, μ0 is a vacuum magnetic permeability, and ∈0 is a vacuum permeability. ### Claim 3 (depends on 2) The computer-readable recording medium which stores a waveform verification program according to claim 2, wherein the waveform verification program causes the computer to perform a process including ending determination of the relative permittivity based on equations ∈r(0)=∈r_min and ɛ ⁢ ⁢ r ⁡ ( n + 1 ) = ( UI N × L ⁢ μ 0 ⁢ ɛ 0 + ɛ ⁢ ⁢ r ⁡ ( n ) ) 2 , at a point in time at which the relative permittivity ∈r(n+1) of the substrate in the (n+1)-th division position is equal to or greater than the maximum value of the substrate relative permittivity variation range. ### Claim 4 (depends on 1) The computer-readable recording medium which stores a waveform verification program according to claim 1, wherein the waveform verification program causes the computer to perform a process including displaying the generated eye pattern on a display section. ### Claim 5 (depends on 1) The computer-readable recording medium which stores a waveform verification program according to claim 1, wherein the waveform verification program causes the computer to perform a process including judging the quality of the signal waveform based on the generated eye pattern. ### Claim 6 An information processing device comprising: a memory; and one or more processors which are coupled to the memory, wherein the one or more processors performs a process including verifying a quality of a signal waveform that is propagated through focused wiring on a substrate; and storing information which is used for the verification of the quality of the signal waveform, and wherein the verifying includes determining a relative permittivity of the substrate in a division position of a variation range of the relative permittivity of the substrate such that a variation range of a propagation delay time of the signal waveform corresponding to the variation range of the relative permittivity of the substrate is divided at even intervals; generating an analysis model corresponding to the relative permittivity of the substrate in the determined division position; performing waveform analysis on the signal waveform using the generated analysis model; and generating an eye pattern according to the waveform analysis performed on the signal waveform for each analysis model. ### Claim 7 (depends on 6) The information processing device according to claim 6, wherein, if it is assumed that the relative permittivity of the substrate in an n-th (n is an integer which is equal to or greater than 0) division position is ∈r(n), the verifying includes respectively determining the relative permittivities ∈r(0) and ∈r(n+1) of the substrate in 0-th and (n+1)-th division positions by equations ∈r(0)=∈r_min and ɛ ⁢ ⁢ r ⁡ ( n + 1 ) = ( UI N × L ⁢ μ 0 ⁢ ɛ 0 + ɛ ⁢ ⁢ r ⁡ ( n ) ) 2 , where, ∈r_min is a minimum value of the variation range of the relative permittivity of the substrate, L is a wiring length of the focused wiring, a Unit Interval (UI) is a time of one bit length of a data signal (inverse number of a bit rate), N is the number of divisions performed on bits in a case of the waveform analysis, μ0 is a vacuum magnetic permeability, and ∈0 is a vacuum permeability. ### Claim 8 (depends on 7) The information processing device according to claim 7, wherein the verifying includes ending determination of the relative permittivity based on equation (13) at a point of time in which the relative permittivity ∈r(n+1) of the substrate in the (n+1)-th division position is equal to or greater than the maximum value of the substrate relative permittivity variation range. ### Claim 9 (depends on 6) The information processing device according to claim 6, wherein the verifying includes displaying the generated eye pattern on a display. ### Claim 10 (depends on 6) The information processing device according to claim 6, wherein the verifying includes judging the quality of the signal waveform based on the generated eye pattern. ### Claim 11 A waveform verification method for causing a computer to verify a quality of a signal waveform that is propagated through focused wiring on a substrate, the waveform verification method comprising: determining a relative permittivity of the substrate in a division position of a variation range of the relative permittivity of the substrate such that a variation range of a propagation delay time of the signal waveform corresponding to the variation range of the relative permittivity of the substrate is divided at even intervals; generating an analysis model corresponding to the relative permittivity of the substrate in the determined division position; and performing waveform analysis on the signal waveform using the generated analysis model; and generating an eye pattern according to the waveform analysis performed on the signal waveform for each analysis model. ### Claim 12 (depends on 11) The waveform verification method according to claim 11, wherein, if it is assumed that the relative permittivity of the substrate in an n-th (n is an integer which is equal to or greater than 0) division position is ∈r(n), the relative permittivities ∈r(0) and ∈r(n+1) of the substrate in 0-th and (n+1)-th division positions are determined by equations ∈r(0)=∈r_min and ɛ ⁢ ⁢ r ⁡ ( n + 1 ) = ( UI N × L ⁢ μ 0 ⁢ ɛ 0 + ɛ ⁢ ⁢ r ⁡ ( n ) ) 2 , where, ∈r_min is a minimum value of the variation range of the relative permittivity of the substrate, L is a wiring length of the focused wiring, a Unit Interval (UI) is a time of one bit length of a data signal (inverse number of a bit rate), N is the number of divisions performed on bits in a case of the waveform analysis, μ0 is a vacuum magnetic permeability, and ∈0 is a vacuum permeability. ### Claim 13 (depends on 12) The waveform verification method according to claim 12, wherein the determination of the relative permittivity based on equations ∈r(0)=∈r_min and ɛ ⁢ ⁢ r ⁡ ( n + 1 ) = ( UI N × L ⁢ μ 0 ⁢ ɛ 0 + ɛ ⁢ ⁢ r ⁡ ( n ) ) 2 , ends at a point in time at which the relative permittivity ∈r(n+1) of the substrate in the (n+1)-th division position is equal to or greater than the maximum value of the substrate relative permittivity variation range. ### Claim 14 (depends on 11) The waveform verification method according to claim 11, wherein the generated eye pattern is displayed on a display. ### Claim 15 (depends on 11) The waveform verification method according to claim 11, wherein the quality of the signal waveform is judged based on the generated eye pattern.