# US 10,120,430 B2 · Dynamic reliability quality monitoring > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,120,430 B2 - Document ID: US10120430B2 - Status: Granted - Kind: B2 - Application number: 15/258,816 - Filed: 2016-09-07 - Published: 2018-03-08 - Granted: 2018-11-06 - Earliest claimed: 2016-09-07 - Assignees: Advanced Micro Devices, Inc.; ATI Technologies ULC - Applicants: Advanced Micro Devices, Inc.; ATI Technologies ULC - Inventors: Stephen V. Kosonocky; Thomas Burd; Adam Clark; Larry D. Hewitt; John Vincent Faricelli; John P. Petry - Web page: https://patentgrep.com/patent/US10120430B2 ## CPC - G06F 1/3209: Monitoring remote activity, e.g. over telephone lines or network connections - G01R 31/2856: {Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]} - G01R 31/2874: {related to temperature} - G06F 1/3206: Monitoring of events, devices or parameters that trigger a change in power modality - G06F 1/3234: Power saving characterised by the action undertaken - G06F 11/008: {Reliability or availability analysis} - G06F 11/3409: {for performance assessment} - G06F 11/3058: {Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations (thermal management in cooling arrangements of a computing system G06F1/206)} - G06F 11/3466: {Performance evaluation by tracing or monitoring} - Y02D 10/00: Energy efficient computing, e.g. low power processors, power management or thermal management - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - Y02D: CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE ## Abstract A system and method for managing operating modes within a semiconductor chip for optimal power and performance while meeting a reliability target are described. A semiconductor chip includes a functional unit and a corresponding reliability monitor. The functional unit provides actual usage values to the reliability monitor. The reliability monitor determines expected usage values based on a reliability target and the age of the semiconductor chip. The reliability monitor compares the actual usage values and the expected usage values. The result of this comparison is used to increase or decrease current operational parameters. ## Claims ### Claim 1 A semiconductor chip comprising: a functional unit; a monitor comprising circuitry configured to: monitor an actual usage of the functional unit; compare the actual usage of the functional unit to an expected usage of the functional unit, wherein the expected usage is based at least in part on an age of the functional unit; and provide information corresponding to said compare; a power manager comprising circuitry configured to: update operating parameters of the functional unit to change power consumption for the functional unit responsive to the information; and send the updated operating parameters to the functional unit; wherein in response to determining the actual usage is less than the expected usage, the updated operating parameters include maximum values for the operating parameters that are greater than current maximum values for the operating parameters. ### Claim 2 (depends on 1) The semiconductor chip as recited in claim 1, wherein the operating parameters include one or more of an operational voltage and a power-performance state associated with maximum performance. ### Claim 3 (depends on 1) The semiconductor chip as recited in claim 1, wherein in response to determining the actual usage is greater than the expected usage, the updated operating parameters include maximum values for the operating parameters that are less than current maximum values for the operating parameters. ### Claim 4 (depends on 1) The semiconductor chip as recited in claim 1, wherein responsive to a first command, the power manager is configured to update maximum values for the operating parameters. ### Claim 5 (depends on 1) The semiconductor chip as recited in claim 1, wherein in response to determining the actual usage is different than the expected usage, the monitor is further configured to change the expected usage of the functional unit. ### Claim 6 (depends on 1) The semiconductor chip as recited in claim 1, wherein monitoring the actual usage comprises receiving values comprising one or more of an operational voltage and a temperature measurement. ### Claim 7 (depends on 6) The semiconductor chip as recited in claim 6, wherein the monitor is further configured to: maintain a reliability metric as an accumulated value over time based at least upon the actual usage of the functional unit and the age of the functional unit; and compare the reliability metric with a reliability target. ### Claim 8 (depends on 7) The semiconductor chip as recited in claim 7, wherein the monitor is further configured to store the reliability metric to non-volatile memory responsive to detecting a given time interval has elapsed. ### Claim 9 (depends on 1) The semiconductor chip as recited in claim 1, wherein the semiconductor chip further comprises: a plurality of voltage/clock domains, each operating with operating parameters; and a plurality of monitors, each configured to: receive actual usage values from a respective one of the plurality of voltage/clock domains; and compare the actual usage values to expected usage values of the voltage/clock domains. ### Claim 10 A method comprising: operating a functional unit of a processor; comparing, by a monitor comprising circuitry, an actual usage of the functional unit to an expected usage of the functional unit, wherein the expected usage is based at least in part on an age of the functional unit; and updating, by a power manager comprising circuitry, operating parameters of the functional unit to change power consumption for the functional unit, in response to determining the actual usage is different from the expected usage; wherein in response to determining the actual usage is less than the expected usage, the updating comprises changing maximum values of the operating parameters to be greater than current maximum values of the operating parameters such that the functional unit operates at a higher performance level. ### Claim 11 (depends on 10) The method as recited in claim 10, wherein the operating parameters include one or more of an operational voltage and a power-performance state. ### Claim 12 (depends on 10) The method as recited in claim 10, wherein in response to determining the received actual usage values are greater than the expected usage values, the updating comprises changing maximum values of the operating parameters to be less than current maximum values of the operating parameters. ### Claim 13 (depends on 10) The method as recited in claim 10, wherein in response to determining the actual usage is different than the expected usage, the method further comprises changing the expected usage of the functional unit. ### Claim 14 (depends on 10) The method as recited in claim 10, wherein the actual usage values comprise one or more of an operational voltage and an on-die temperature measurement. ### Claim 15 An on-die reliability monitor comprising: a first interface comprising circuitry configured to receive information indicative of an actual usage of a functional unit; control logic comprising circuitry configured to: compare the actual usage of the functional unit to an expected usage of the functional unit; and generate information usable to change operating parameters of the functional unit, in response to determining the actual usage is different than the expected usage; and a second interface comprising circuitry configured to convey the information to a power manager; wherein in response to determining the received actual usage is less than the expected usage, the information indicates an increase in maximum values for the operating parameters. ### Claim 16 (depends on 15) The reliability monitor as recited in claim 15, wherein in response to determining the received actual usage is less than the expected usage, the information indicates an increase in maximum values for the operating parameters. ### Claim 17 (depends on 15) The reliability monitor as recited in claim 15, wherein in response to determining the received actual usage is greater than the expected usage, the information indicates a decrease in maximum values for the operating parameters. ### Claim 18 (depends on 15) The reliability monitor as recited in claim 15, wherein the information indicative of the actual usage values comprise one or more of an operational voltage and an on-die temperature measurement. ### Claim 19 A system comprising: a functional unit; a system management unit including operational instructions comprising an algorithm for adapting operating parameters over time; a monitor comprising circuitry configured to: monitor an actual usage of the functional unit; compare the actual usage of the functional unit to an expected usage of the functional unit, wherein the expected usage is based at least in part on an age of the functional unit; and provide information corresponding to said compare; a power manager comprising circuitry configured to: update operating parameters of the functional unit to change power consumption for the functional unit, responsive to the information and the operational instructions; and send the updated operating parameters to the functional unit; wherein in response to determining the actual usage is less than the expected usage, the updated operating parameters include maximum values for the operating parameters that are greater than current maximum values for the operating parameters. ### Claim 20 (depends on 19) The system as recited in claim 19, wherein in the operational instructions comprise firmware. ### Claim 21 (depends on 19) The system as recited in claim 19, wherein the operational instructions may be updated. ### Claim 22 (depends on 19) The system as recited in claim 19, wherein the operational instructions reside in non-volatile memory. ### Claim 23 (depends on 19) The system as recited in claim 19, wherein the operating parameters include one or more of an operational voltage and a power-performance state associated with maximum performance. ### Claim 24 (depends on 19) The system as recited in claim 19, wherein in response to determining the actual usage is greater than the expected usage, the updated operating parameters include maximum values for the operating parameters that are less than current maximum values for the operating parameters.