# US 10,120,008 B2 · Method and apparatus for estimating the noise introduced by a device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,120,008 B2 - Document ID: US10120008B2 - Status: Granted - Kind: B2 - Application number: 14/014,067 - Filed: 2013-08-29 - Published: 2015-03-05 - Granted: 2018-11-06 - Earliest claimed: 2013-08-29 - Assignees: Keysight Technologies, Inc. - Applicants: Keysight Technologies, Inc. - Inventors: Robert T. Cutler - Web page: https://patentgrep.com/patent/US10120008B2 ## CPC - G01R 31/001: {Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing (measuring electromagnetic fields G01R29/08; circuits for generating HV pulses in dielectric strength testing G01R31/14)} - G01R 29/26: Measuring noise figure; Measuring signal-to-noise ratio - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract An apparatus and method for measuring the properties of a DUT characterized by a signal gain applied to an input signal to that DUT and a DUT noise spectrum introduced by that DUT is disclosed. An apparatus includes first and second measurement channels and a controller. The first and second measurement channels are characterized by gains and noise spectrums that are different for the different channels and generate first and second measurement signals. The controller measures an average value of a product of the first and second measurement signals when an input signal is applied to the input of the DUT, the controller providing a measure of the signal to noise ratio of the output of the DUT, independent of the noise spectrums in the first and second measurement channels. Four channel embodiments reduce the amount of calibration needed to measure the gain and noise spectrum of the DUT. ## Claims ### Claim 1 An apparatus for measuring a first DUT characterized by a first DUT input, a first DUT output, a first DUT signal gain and a first DUT noise spectrum introduced by that first DUT, said apparatus comprising: a first measurement channel that generates a first measurement signal characterized by a first gain and a first noise spectrum introduced by that channel, said first measurement channel being coupled to said first DUT output; a second measurement channel that generates a second measurement signal characterized by a second gain and a second noise spectrum introduced by that channel, said second measurement channel being coupled to said first DUT output; and a controller that measures an average value of a cross product of frequency spectrums of said first measurement signal and said second measurement signal when an input signal is input to said first DUT input, said controller providing a measure of a signal-to-noise ratio (SNR) of a signal leaving said first DUT output, said measure being independent of said first noise spectrum and said second noise spectrum. ### Claim 2 (depends on 1) The apparatus of claim 1 wherein said controller determines a first calibration product comprising said average value of said cross product when an input signal is applied to said first DUT input, said input signal having a known noise spectrum, said first calibration product being used to generate an SNR measurement of said first DUT. ### Claim 3 (depends on 2) The apparatus of claim 2 wherein said controller determines a second calibration product comprising said average value of said cross product of said first measurement signal and said second measurement signal using a second DUT consisting of a through connection that shorts an input and an output of said second DUT, said second calibration product being used to generate a measurement of said first DUT signal gain and said first DUT noise spectrum. ### Claim 4 (depends on 1) The apparatus of claim 1 further comprising: a third measurement channel that generates a third measurement signal characterized by a third gain and a third noise spectrum introduced by that channel, said third measurement channel being coupled to said first DUT input; and a fourth measurement channel that generates a fourth measurement signal characterized by a fourth gain and a fourth noise spectrum introduced by that channel, said fourth measurement channel being coupled to said first DUT input, wherein said controller measures an average value of a cross product of frequency spectrums of said third and fourth measurement signals, two cross average values comprising average values of cross products of frequency spectrums of one of said first or second measurement signals with one of said third or fourth measurement signals when an input signal is applied to said first DUT input, said controller providing a measure of a SNR of an output signal from said first DUT output, independent of said first, second, third, and fourth noise spectrums and independent of any separate calibration measurements using a different DUT. ### Claim 5 (depends on 4) The apparatus of claim 4 wherein said controller measures an average value of cross products of frequency spectrums of said third and fourth measurement signals when said first DUT is replaced by a second DUT comprising a short circuit between an input to said second DUT and an output of said second DUT, and wherein said apparatus further comprises a power meter that measures an output power from said second DUT, said controller generating a measure of said first DUT signal gain and a measure of said first DUT noise spectrum from said measurements on said first DUT and said measurements on said second DUT. ### Claim 6 (depends on 1) The apparatus of claim 1 wherein said first noise spectrum and said second noise spectrum comprise components that are correlated with one another, and wherein said controller provides corrections to said average value that correct for said components. ### Claim 7 (depends on 6) The apparatus of claim 6 wherein said corrections are determined by replacing said first DUT with a second DUT in which an input of said second DUT is shorted to an output of said second DUT. ### Claim 8 A method of operating an apparatus to measuring a first DUT characterized by a first DUT input, a first DUT output, a first DUT signal gain and a first DUT noise spectrum introduced by that first DUT, said method comprising: generating a first measurement signal characterized by a first gain and a first noise spectrum introduced by a first measurement channel, said first measurement channel being coupled to said first DUT output; generating a second measurement signal characterized by a second gain and a second noise spectrum introduced by a second measurement channel, said second measurement channel being coupled to said first DUT output; causing said apparatus to measure an average value of a cross product of frequency spectrums of said first measurement signal and said second measurement signal when an input signal is applied to said first DUT input; and providing a measure of a SNR of a signal that is output from said first DUT output, independent of said first and second noise spectrums. ### Claim 9 (depends on 8) The method of claim 8 comprising determining a first calibration product comprising said average value of said cross product using an input signal having a known noise spectrum, said first calibration product being used to generate an SNR measurement of said first DUT. ### Claim 10 (depends on 9) The method of claim 9 comprising determining a second calibration product comprising said average value of said cross product of said first measurement signal and said second measurement signal using a second DUT comprising a through connection that shorts an input of said second DUT and to an output of said second DUT, said second calibration product being used to generate a measurement of said first DUT signal gain and said first DUT noise spectrum. ### Claim 11 (depends on 8) The method of claim 8 further comprising: generating a third measurement signal characterized by a third gain and a third noise spectrum introduced by a third measurement channel, said third measurement channel being coupled to said input of said first DUT; and generating a fourth measurement signal characterized by a fourth gain and a fourth noise spectrum introduced by a fourth measurement channel, said fourth measurement channel being coupled to said input of said first DUT, measuring an average value of a cross product of frequency spectrums of said third and fourth measurement signals, two cross average values comprising average values of cross products of frequency spectrums of one of said first or second measurement signals with one of said third or fourth measurement signals when an input signal is applied to said input of said first DUT, and providing a measure of a SNR of the output of said first DUT, independent of said first, second, third, and fourth noise spectrums and independent of any separate calibration measurements using a different DUT. ### Claim 12 (depends on 11) The method of claim 11 comprising measuring an average value of products of frequency spectrums of said third and fourth measurement signals when said first DUT is replaced by a second DUT comprising a short circuit between an input to said second DUT and an output of said second DUT, and wherein said method further comprises measuring an output power from said second DUT and generating a measure of said first DUT signal gain and said first DUT noise spectrum from said measurements on said first DUT and said second DUT. ### Claim 13 (depends on 8) The method of claim 8 wherein said first noise spectrum and said second noise spectrum comprise components that are correlated with one another, and said method provides corrections to said average value that correct for said components. ### Claim 14 (depends on 13) The method of claim 13 wherein said corrections are determined by replacing said first DUT with a second DUT in which an input of said second DUT is shorted to an output of said second DUT.