# US 10,119,992 B2 · High impedance compliant probe tip > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,119,992 B2 - Document ID: US10119992B2 - Status: Granted - Kind: B2 - Application number: 14/676,703 - Filed: 2015-04-01 - Published: 2016-10-06 - Granted: 2018-11-06 - Earliest claimed: 2015-04-01 - Assignees: Tektronix, Inc. - Applicants: Tektronix, Inc. - Inventors: William A. Hagerup; Julie A. Campbell; Ira G. Pollock; James E. Spinar; Kathleen F. M. Ullom; Charles M. Hartmann; Daniel J. Ayres; Christina D. Enns - Web page: https://patentgrep.com/patent/US10119992B2 ## CPC - G01R 1/06722: {Spring-loaded} - G01R 1/06788: {Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments (end pieces terminating in a probe H01R11/18)} - G01R 1/06733: {Geometry aspects (G01R1/06727 takes precedence)} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon. ## Claims ### Claim 1 A test probe tip, comprising: a force deflecting assembly; a resistor configured to be coupled with the force deflecting assembly, wherein the resistor comprises: a first rod having a substantially semi-cylindrical form that includes a first side extending along a longitudinal axis; a second rod having a substantially semi-cylindrical form that includes a second side extending along the longitudinal axis; and a resistive material disposed between the first side and the second side, such that the resistive element has a substantially cylindrical form with the resistive material providing a conductive path through the center of the cylindrical form; and a tip component configured to be coupled with the resistor, wherein the longitudinal axis extends from the force deflecting assembly to the tip component. ### Claim 2 (depends on 1) The test probe tip of claim 1, wherein the first rod comprises zirconia. ### Claim 3 (depends on 1) The test probe tip of claim 1, wherein each of the first and second rods comprise zirconia. ### Claim 4 (depends on 1) The test probe tip of claim 1, further comprising an adhesive material that couples the first side with the resistive material and the second side with the resistive material, wherein the adhesive material is a non-conductive epoxy such that the adhesive material forms an insulative layer between the first side and the resistive material and the second side and the resistive material. ### Claim 5 (depends on 1) The test probe tip of claim 1, wherein the force deflecting assembly includes: a plunger component configured to be coupled with the resistor element; a barrel component configured to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component; and a spring mechanism positioned within the barrel component and configured to act on the plunger component responsive to the plunger component sliding in an inward direction inside the barrel component. ### Claim 6 (depends on 1) The test probe tip of claim 1, wherein the tip component includes at least one point configured to establish an electrical connection with a test point on a device under test (DUT). ### Claim 7 (depends on 5) The test probe tip of claim 5, wherein the spring mechanism is configured to create a compression resistance between the probe tip and a test point on a device under test (DUT). ### Claim 8 (depends on 1) The test probe tip of claim 1, wherein the resistive material is a film resistive material. ### Claim 9 A test probe, comprising: a test probe body; and a test probe tip integrated with the test probe body, the test probe tip including: a compliance member; a resistor configured to be coupled with the compliance member, wherein the resistor comprises: a first rod having a substantially semi-cylindrical form that includes a first side extending along a longitudinal axis; a second rod having a substantially semi-cylindrical form that includes a second side extending along the longitudinal axis; and a resistive material structurally coupling the first side with the second side, such that the resistive element has a substantially cylindrical form with the resistive material providing a conductive path through the center of the cylindrical form; and a tip component configured to be coupled with the resistor, wherein the longitudinal axis extends from the force deflecting assembly to the tip component. ### Claim 10 (depends on 9) The test probe tip of claim 9, wherein the first rod comprises zirconia. ### Claim 11 (depends on 9) The test probe tip of claim 9, wherein each of the first and second rods comprises zirconia. ### Claim 12 (depends on 9) The test probe tip of claim 9, further comprising an adhesive material that couples the first side with the resistive material and the second side with the resistive material, wherein the adhesive material is a non-conductive epoxy such that the adhesive material forms an insulative layer between the first side and the resistive material and the second side and the resistive material. ### Claim 13 (depends on 9) The test probe of claim 9, wherein the compliance member includes: a plunger component; a barrel component configured to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component; a spring mechanism positioned within the barrel component and configured to act on the plunger component responsive to the plunger component sliding in an inward direction inside the barrel component. ### Claim 14 (depends on 9) The test probe of claim 9, wherein the tip component includes at least one point configured to establish an electrical connection between the test probe and a test point on a device under test (DUT). ### Claim 15 (depends on 13) The test probe of claim 13, wherein the spring mechanism is configured to create a compression resistance between the test probe and a test point on a device under test (DUT). ### Claim 16 (depends on 9) The test probe of claim 9, wherein the resistive material is a film resistive material. ### Claim 17 (depends on 9) The test probe of claim 9, wherein the test probe tip is a first test probe tip, the test probe further comprising a second test probe tip in a same configuration as the first test probe tip, such that the test probe is a differential test probe.