# US 10,117,708 B2 · Ablation needle including fiber Bragg grating > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,117,708 B2 - Document ID: US10117708B2 - Status: Granted - Kind: B2 - Application number: 15/671,859 - Filed: 2017-08-08 - Published: 2017-11-23 - Granted: 2018-11-06 - Earliest claimed: 2012-07-19 - Assignees: Covidien LP - Applicants: Covidien LP - Inventors: Duane E. Kerr - Web page: https://patentgrep.com/patent/US10117708B2 ## CPC - A61B 18/1477: {Needle-like probes} - A61B 18/1206: {Generators therefor} - G01D 5/35316: {using a Bragg gratings} - G01K 11/3206: at discrete locations in the fibre, e.g. using Bragg scattering - G01L 1/246: {using integrated gratings, e.g. Bragg gratings} - A61B 2017/00057: {Light} - A61B 2017/00061: {spectrum} - A61B 2017/00115: {with audible or visual output} - A61B 2018/00178: {Electrical connectors} - A61B 2018/00577: {Ablation} - A61B 2018/00791: {Temperature} - A61B 2018/00875: {Resistance or impedance} - A61B 2018/1425: {Needle} - A61B 2090/064: {for measuring force, pressure or mechanical tension} - A61B: DIAGNOSIS; SURGERY; IDENTIFICATION (usefulness limited to only animals A61D) - G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR - G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR (radiation pyrometry G01J5/00) - G01L: MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE (weighing G01G) ## Abstract A surgical device is disclosed, and includes a probe having a handle assembly and an electrode assembly extending distally therefrom. An optical member is disposed on the probe and has a first set of light transmitting properties corresponding to a first set of physical parameters of the probe. The probe is configured to transition to a second set of physical parameters, the second set of physical parameters being different from the first set of physical parameters. The optical member is configured to transition from the first set of light transmitting properties to a second set of light transmitting properties, the second set of light transmitting properties corresponding to the second set of physical parameters, the second set of light transmitting properties being different from the first set of light transmitting properties. ## Claims ### Claim 1 A method of determining tissue characteristics based on engagement with an electrosurgical device, the method comprising: inserting an electrosurgical device into an object, the electrosurgical device having an electrode assembly and a light source configured to transmit light through an optical member at least partially disposed within a portion of the electrode assembly; measuring a first wavelength of light transmitted through the optical member; applying electrical energy to the electrode assembly; measuring a second wavelength of light transmitted through the optical member; and comparing the first wavelength of light to the second wavelength of light to determine a change in spacing between a plurality of segments of the optical member resulting from applying the electrical energy to the electrode assembly. ### Claim 2 (depends on 1) The method of claim 1, wherein comparing the first wavelength of light to the second wavelength of light includes determining a change in temperature of the electrode assembly. ### Claim 3 (depends on 1) The method of claim 1, wherein comparing the first wavelength of light to the second wavelength of light includes determining at least one of a change in temperature or a change in mechanical strain on the electrode assembly. ### Claim 4 (depends on 1) The method of claim 1, wherein the electrosurgical device includes a plurality of electrode assemblies. ### Claim 5 (depends on 4) The method of claim 4, further comprising comparing for each of the electrode assemblies comparing the first wavelength of light to the second wavelength of light. ### Claim 6 (depends on 5) The method of claim 5, further comprising generating a thermal profile based on comparing the first wavelength of light to the second wavelength of light for each of the electrode assemblies. ### Claim 7 An electrosurgical device, comprising: an electrode assembly; a light source configured to transmit light through an optical member at least partially disposed within a portion of the electrode assembly; a sensor disposed along the electrode assembly configured to measure wavelengths of light transmitted through the optical member; and a controller in electrical communication with the optical member and the sensor, the controller configured to: receive a first sensor signal based on a first wavelength of light transmitted through the optical member, transmit a control signal to an electrosurgical generator coupled to the electrosurgical device to apply electrical energy to the electrode assembly, receive a second sensor signal based on a second wavelength of light transmitted through the optical member; and compare the first wavelength of light to the second wavelength of light and determine a change in spacing between a plurality of segments of the optical member resulting from applying the electrical energy to the electrode assembly. ### Claim 8 (depends on 7) The electrosurgical device of claim 7, wherein comparing the first wavelength of light to the second wavelength of light includes determining a change in temperature of the electrode assembly. ### Claim 9 (depends on 7) The electrosurgical device of claim 7, wherein the electrosurgical device includes a plurality of electrode assemblies. ### Claim 10 (depends on 9) The electrosurgical device of claim 9, wherein the controller is further configured to compare the first wavelength of light to the second wavelength of light for each of the respective electrode assemblies. ### Claim 11 (depends on 10) The electrosurgical device of claim 10, wherein the controller is further configured to generate a thermal profile based on the first wavelength of light and the second wavelength of light of each of the electrode assemblies. ### Claim 12 A method of measuring characteristics of an electrosurgical device, the method comprising: projecting light from a light source of an electrosurgical device through an optical member at least partially disposed within an electrode assembly of the electrosurgical device; measuring a first wavelength of light transmitted through the optical member; inserting at least a portion of the electrode assembly into an object such that a force is applied to the electrode assembly; measuring a second wavelength of light transmitted through the optical member while the force is applied; and comparing the first wavelength of light to the second wavelength of light to determine a change in spacing between a plurality of segments of the optical member resulting from the force. ### Claim 13 (depends on 12) The method of claim 12, wherein comparing the first wavelength of light to the second wavelength of light includes determining a change in temperature of the electrode assembly. ### Claim 14 (depends on 12) The method of claim 12, wherein comparing the first wavelength of light to the second wavelength of light includes determining at least one of a change in temperature or a change in mechanical strain on the electrode assembly. ### Claim 15 (depends on 12) The method of claim 12, wherein projecting light includes projecting light through a plurality of optical member at least partially disposed within respective electrode assemblies of the electrosurgical device. ### Claim 16 (depends on 15) The method of claim 15, wherein comparing the first wavelength of light to the second wavelength of light includes comparing the first wavelength of light to the second wavelength of light of each of the electrode assemblies. ### Claim 17 (depends on 16) The method of claim 16, further comprising generating a thermal profile based on comparing the first wavelength of light to the second wavelength of light for each of the electrode assemblies.