Back to results
US 10,114,073 B2Granted
Integrated circuit testing
AssigneeRambus Inc.
InventorAdrian E. Ong
Life of this patent
Estimating the term…
Abstract
Systems and methods of testing integrated circuits are disclosed. A system may include a data compression component to compress data received from an integrated circuit under test at a first clock frequency, to generate compressed data. The system may also include a data output component, operatively coupled to the data compression component, to convey the compressed data to automated testing equipment at a second clock frequency.
Claims18
A system comprising:
- a data compression component to compress data received from an integrated circuit under test at a first clock frequency, to generate compressed data;
- and
- a data output component, operatively coupled to the data compression component, to convey the compressed data to automated testing equipment at a second clock frequency, wherein the first clock frequency provides testing of the integrated circuit at a higher frequency than the second clock frequency.
A system comprising:
- a data compression component to compress data received from an integrated circuit to generate compressed data, the compression being responsive to an address within the integrated circuit from which the data was received, wherein the compression is performed at a first clock frequency;
- and
- a data output component, operatively coupled with the data compression component, to convey the compressed data to the automated testing equipment, wherein the compressed data is conveyed at a second clock frequency different than the first clock frequency.
A method comprising:
- compressing, by a test device, received data responsive to expected data, to generate compressed data, wherein the compression is performed at a first clock frequency;
- and
- providing, by the test device, the compressed data to the automated testing equipment, wherein the compressed data is provided at a second clock frequency different than the first clock frequency.
Dependencies are inferred from the claim text.