Thermal imaging calibration system and method
AssigneeLeonardo Mw Ltd
InventorLuke Alexander Pillans
Life of this patent
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Abstract
A system and method for calibrating an imaging system includes a shutter that is moveable in to the optical path of the imaging system to generate an image of the shutter surface, which is flat and uniform. The shutter can be moved in and out of the optical path between first and second positions. The shutter is heated while in the second position and then returned to the first position. Data sets generated at two different temperatures enable the image generated by the imaging system in normal use to be to be adjusted for responsivity and variation in DC offset of the specific pixel array.
Claims8
A system for calibrating an IR detector having an array of pixels in an imaging system, the calibration system comprising:
- a heat source;
- and
- a shutter moveable from a first position to a second position, the shutter being disposed in an optical path of an imaging system in the first position and outside of the optical path in the second position, the shutter, when in the second position, being situated adjacent the heat source, the heat source, when operational, heating the shutter to a predetermined temperature, such that the shutter may be moved in to the optical path when in a heated or unheated state thereby enabling two sets of data to be generated, a first set representative of the system at a first temperature and the second set representative of the system at a second temperature,
- wherein the heat source is not in contact with the shutter at the second position.
A method of calibrating a thermal imaging system having a pixel array, the method comprising:
- (a) moving a shutter in an the optical path of the imaging system;
- (b) measuring flat field data relating to the pixel array at a first temperature;
- (c) removing the shutter from the optical path;
- (d) positioning the shutter, when outside the optical path, to be adjacent to and not in contact with a heat source for a predetermined time thereby changing the temperature of the shutter to a predetermined second temperature;
- (e) moving the shutter back in to the optical path of the imaging system;
- (f) measuring flat field data relating to the pixel array at the second predetermined temperature;
- and
- (g) comparing images taken at the first temperature and the second temperature for correction of offset and gain of each pixel.
Dependencies are inferred from the claim text.