Method for evaluating piezoelectric film, piezoelectric element, liquid ejecting head, and liquid ejecting apparatus

A liquid ejecting head comprising a nozzle opening, a pressure generating chamber brought into communication with the nozzle opening, and a piezoelectric element and ejecting liquid from the nozzle opening by an operation of the piezoelectric element, wherein

• the piezoelectric element has a piezoelectric film containing a perovskite oxide containing a lead atom, a zirconium atom, and a titanium atom,
• a radial distribution function obtained by Fourier-transforming an extended X-ray absorption fine structure (EXAFS) spectrum at an L3 absorption edge of the lead atom of the piezoelectric film has a first peak having a distance from the lead atom of 1.4±0.2 Å, a second peak having a distance from the lead atom of 2.0±0.2 Å, and a third peak having a distance from the lead atom of 2.6±0.2 Å, and
• when a value obtained by dividing the intensity of the first peak by intensity of the second peak is defined as A and a value obtained by dividing the intensity of the first peak by intensity of the third peak is defined as B,
• the piezoelectric film satisfies at least one of conditions that the A is in a range of 0.35 to 0.75 and the B is in a range of 0.35 to 0.75.