US 10,096,459 B2 · Mass filtering of ions using a rotating field

Abstract

Systems and methods for filtering a continuous beam of ions are provided. An acceleration electric field is applied to a continuous beam of ions using an accelerator to produce an accelerated beam of ions. A field is applied to the accelerated beam to separate ions in time and space using a deflector producing a separated beam of ions. The field applied by the deflector is a rotating field or a circulant rastering field. The rotating field can be a rotating magnetic or electric field. Only accept those ions from the separated beam whose m/z values lie within a range centered around a target m/z value using an aperture. The aperture can include a pinhole aperture in a rotating disk or an annular aperture in a first stationary disk, a second deflector, and a pinhole aperture in the center of a second stationary disk.

Claims7

Dependent claims

A mass filter for filtering a continuous beam of ions, comprising:

an accelerator that receives a continuous beam of ions and applies an acceleration electric field to the continuous beam of ions producing an accelerated beam of ions;
a deflector that applies a rotating electric or magnetic field to the accelerated beam to separate ions in time and space producing a separated beam of ions;
and
an aperture that accepts only those ions from the separated beam whose m/z values lie within a range centered around a target m/z value, wherein the aperture comprises a rotating disk with a pinhole aperture.

1 more element

Dependencies are inferred from the claim text.

Mass filtering of ions using a rotating field

Life of this patent

Mass filtering of ions using a rotating field

Life of this patent

Abstract

Claims7