Low temperature plasma probe with auxiliary heated gas jet
AssigneeSmiths Detection Inc.
InventorsVadym Berkout, Thomas D. Saul
Life of this patent
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Abstract
A low temperature plasma probe, a mass spectrometry system, and a method for using a low temperature plasma probe are described. In an embodiment, a low temperature plasma probe includes an intake capillary that provides an ion flow from a sample surface to a mass spectrometer; at least one low temperature plasma tube that provides low temperature plasma gas; at least one heated gas tube that provides heated gas to the sample surface, where the heated gas enhances desorption and ionization of a sample on the sample surface.
Claims20
A low temperature plasma probe, comprising:
- an intake capillary that provides an ion flow from a sample surface to a mass spectrometer;
- at least one low temperature plasma tube that provides low temperature plasma gas, the at least one low temperature plasma tube including an outer tube that is concentric with the intake capillary, the intake capillary comprising a first electrode, the outer tube comprising a second electrode, the outer tube configured to have a gas pumped therethrough;
- at least one heated gas tube that provides heated gas to the sample surface, where the heated gas enhances desorption and ionization of a sample on the sample surface.
A mass spectrometry system, comprising:
- a mass spectrometer;
- and
- a low temperature plasma probe coupled to the mass spectrometer, the low temperature plasma probe including
- an intake capillary that provides an ion flow from a sample surface to the mass spectrometer;
- at least one low temperature plasma tube that provides low temperature plasma gas, the at least one low temperature plasma tube including an outer tube that is concentric with the intake capillary, the intake capillary comprising a first electrode, the outer tube comprising a second electrode, the outer tube configured to have a gas pumped therethrough;
- at least one heated gas tube that provides heated gas to the sample surface, where the heated gas enhances desorption and ionization of a sample on the sample surface.
A method for using a low temperature plasma probe, comprising:
- providing a low temperature plasma gas using a low temperature plasma source and at least one low temperature plasma tube;
- providing a heated gas using a heated gas source and at least one heated gas tube, the at least one heated gas tube coupled to the at least one low temperature plasma tube, where a low temperature plasma gas and the heated gas contact a sample;
- receiving an ionized intake flow using an intake capillary, the intake capillary coupled to the at least one low temperature plasma tube, the at least one low temperature plasma tube including an outer tube that is concentric with the intake capillary, the intake capillary comprising a first electrode, the outer tube comprising a second electrode, the outer tube configured to have a gas pumped therethrough, the ionized intake flow including heated gas, low temperature plasma gas, and ions from the sample;
- and
- analyzing the ionized intake flow using a mass spectrometer, the mass spectrometer coupled to the intake capillary.
Dependencies are inferred from the claim text.