Voltage degradation aware NAND array management
AssigneeMicron Technology, Inc.
InventorsSebastien Andre Jean, Harish Singidi
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Abstract
Devices and techniques for voltage degradation aware NAND array management are disclosed herein. Voltage to a NAND device is monitored to detect a voltage event. A history of voltage events is modified with the voltage event. A voltage condition is observed from the history of voltage events. An operational parameter of a NAND array in the NAND device is then modified in response to the voltage condition.
Claims30
A NAND device for voltage degradation aware NAND array management, the NAND device comprising:
- a NAND array;
- and
- a controller to:
- monitor voltage to the NAND device to detect a voltage event;
- modify a history of voltage events with the voltage event;
- observe a voltage condition from the history of voltage events;
- and
- modify an operational parameter of the NAND array in response to the voltage condition.
A method for voltage degradation aware NAND array management, the method comprising:
- monitoring voltage to a NAND device to detect a voltage event;
- modifying a history of voltage events with the voltage event;
- observing a voltage condition from the history of voltage events;
- and
- modifying an operational parameter of a NAND array in the NAND device in response to the voltage condition.
A machine readable medium including instructions that, when executed by processing circuitry, cause the processing circuitry to perform operations comprising:
- monitoring voltage to a NAND device to detect a voltage event;
- modifying a history of voltage events with the voltage event;
- observing a voltage condition from the history of voltage events;
- and
- modifying an operational parameter of a NAND array in the NAND device in response to the voltage condition.
Dependencies are inferred from the claim text.