Test and measurement instrument having advanced triggering capability
AssigneeTektronix, Inc.
InventorsDaniel G. Knierim, David L. Kelly, Jed H. Andrews, Michael A. Martin, Patrick A. Smith
Life of this patent
Estimating the term…
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AssigneeTektronix, Inc.
InventorsDaniel G. Knierim, David L. Kelly, Jed H. Andrews, Michael A. Martin, Patrick A. Smith
Estimating the term…
A test and measurement instrument, including an input configured to receive a signal-under-test, a user input configured to accept a first trigger event and a second trigger event from a user, a first trigger decoder configured to trigger on an occurrence of the first trigger event and generate a first trigger signal, a second trigger decoder configured to trigger on an occurrence of the second trigger event occurring after the first trigger event and generate a second trigger signal, and an acquisition system configured to acquire the signal-under-test in response to the first trigger signal and store the acquired signal-under-test based on whether the second trigger signal validates or invalidates the first trigger signal.
A test and measurement instrument, comprising:
A method for triggering an acquisition of a signal-under-test in a test and measurement instrument, the method comprising:
Dependencies are inferred from the claim text.