Automated sample processing instruments, systems, processes, and methods

An automated instrument for processing a sample, the instrument comprising:

• a movable first rack configured to hold a sample containing receptacle, the first rack defining a first recess;
• a movable second rack configured to hold a processing receptacle, the second rack defining a second recess;
• a first lock comprising a first locking pin configured to be received in the first recess, the first lock configured to move between a locked configuration and an unlocked configuration, wherein the first lock is configured to be engaged with the first rack in the locked configuration of the first lock to secure the first rack within the automated instrument, and wherein the first lock is disengaged from the first rack in the unlocked configuration of the first lock to allow movement of the first rack within the automated instrument;
• a second lock comprising a second locking pin configured to be received in the second recess, the second lock configured to move between a locked configuration and an unlocked configuration, wherein the second lock is configured to be engaged with the second rack in the locked configuration of the second lock to secure the second rack within the automated instrument, and wherein the second lock is configured to be disengaged from the second rack in the unlocked configuration of the second lock to allow movement of the second rack within the automated instrument;
• a robotic arm movable within the automated instrument;
• and
• a controller configured to control the robotic arm to:
• (i) engage and move the first lock to the locked configuration of the first lock,
• (ii) engage and move the first lock to the unlocked configuration of the first lock,
• (iii) engage and move the second lock to the locked configuration of the second lock,
• (iv) engage and move the second lock to the unlocked configuration of the second lock, and
• (v) pick-and-place the sample containing receptacle, the processing receptacle, or both within the automated instrument.