Electrodeposited nano-twins copper layer and method of fabricating the same
AssigneeNational Chiao Tung University
InventorsChih Chen, King-Ning Tu, Taochi Liu
Life of this patent
Estimating the term…
Abstract
An electrodeposited nano-twins copper layer, a method of fabricating the same, and a substrate comprising the same are disclosed. According to the present invention, at least 50% in volume of the electrodeposited nano-twins copper layer comprises plural grains adjacent to each other, wherein the said grains are made of stacked twins, the angle of the stacking directions of the nano-twins between one grain and the neighboring grain is between 0 to 20 degrees. The electrodeposited nano-twins copper layer of the present invention is highly reliable with excellent electro-migration resistance, hardness, and Young's modulus. Its manufacturing method is also fully compatible to semiconductor process.
Claims14
A method for preparing a nano-twins copper metal layer, comprising:
- (A) providing an electrodepositing device, wherein the electrodepositing device comprises an anode, a cathode, a plating solution, and an electrical power supply source, and the electrical power supply source is connected to the anode and the cathode;
- and
- (B) using the electrical power supply source to provide an electrical power to perform electrodeposition at a surface of the cathode to grow a nano-twins copper metal layer;
- wherein over 50% of a volume of the nano-twins copper metal layer comprises a plurality of crystal grains, each crystal grain is connected with one another, each crystal grain is formed as a result of a plurality of nano-twins stacking in a direction of a [111] crystal axis, and an angle included between neighboring crystal grains is 0° to 20°;
- wherein the plating solution comprises a copper-based salt compound, an acid, and a chloride anion supply source;
- and
- wherein the method is used in a preparation of through silicon via (TSV), interconnect of a semiconductor chip, pin through hole of a packaging substrate, metal wire, or substrate circuit.
Dependencies are inferred from the claim text.