Apparatus and method for detecting defects in a metallic surface by moving an eddy coil along a scan path relative to the surface
AssigneeSarclad Limited
InventorRobert Northern
Life of this patent
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AssigneeSarclad Limited
InventorRobert Northern
Estimating the term…
An apparatus and method detect defects in a metal surface. The apparatus is configured to move an eddy coil relative to an underlying metallic surface along a plurality of generally parallel and adjacent scan paths, and to receive from the eddy coil an oscillating signal induced at said coil as it is moved along each path. A representation of the received oscillating signal in relation to each one of a plurality of adjacent scan areas within each path is recorded, and a two-dimensional grid-like map showing the signal representations relative to each scan area is displayed. Defect location is facilitated by a further function of the apparatus and method, by which user input to an interface causes a light source to illuminate a selected part of the metallic surface.
An apparatus for detecting defects in a metallic roll mill, comprising:
A method of detecting defects in a metallic roll mill, the method comprising:
A non-transitory computer-readable storage medium having stored thereon computer-readable code, which, when executed by computing apparatus, causes the computing apparatus to perform a method comprising:
A method of detecting and locating defects in a metallic roll mill including the acts of:
Dependencies are inferred from the claim text.