Semiconductor device
AssigneeMicron Technology, Inc.
InventorsYutaka Ito, Yuan He
Life of this patent
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Abstract
A semiconductor device according to an aspect of the present invention has: a plurality of memory cells MC; a plurality of word lines WL each coupled to a corresponding one of the plurality of memory cells MC; and a control circuit that intermittently monitors accesses to the plurality of word lines WL, stores/erases some captured row-addresses in a first number of registers, and detects, by comparison with stored addresses, in response to a first number of accesses to one of the word lines WL in a first period of time. According to the present invention, access histories can be precisely analyzed by a small-scale circuit configuration, and measures against, for example, the Row Hammer problem, etc. can be taken.
Claims19
An apparatus comprising:
- an address decoder;
- a plurality of first latch circuits coupled in series to each other;
- a plurality of comparators each coupled to the address decoder and a corresponding one of the plurality of first latch circuits to detect whether an address from the address decoder matches a corresponding address stored in the corresponding one of the plurality of latch circuits;
- a second latch circuit coupled to the address decoder, the second latch circuit configured to store the address from the address decoder in detection that at least one of the plurality of comparators detects the address from the address decoder matching the corresponding address;
- and
- a sampling signal generator configured to activate a sampling signal;
- wherein a detection result of the address from the address decoder matching the corresponding address stored in any one of the plurality of the first latch circuits is transmitted to the second latch circuit responsive to an activated sampling signal.
An apparatus comprising:
- an address decoder;
- a plurality of first latch circuits coupled in series to each other;
- a plurality of comparators each coupled to the address decoder and a corresponding one of the plurality of first latch circuits to detect whether an address from the address decoder matches a corresponding address stored in the corresponding one of the plurality of latch circuits;
- a second latch circuit coupled to the address decoder, the second latch circuit configured to store the address from the address decoder in detection that at least one of the plurality of comparators detects the address from the address decoder matching the corresponding address;
- an address scrambler configured to output an additional address based on the address stored in the second latch circuit, the additional address indicating an address physically next to the address stored in the second latch circuit;
- an address generator configured to produce a refresh address responsive to a refresh control signal;
- and
- a multiplexer coupled to the address scrambler and the address generator;
- wherein a refresh operation is performed on the refresh address when the multiplexer connects the address generator to an output node thereof;
- and
- wherein another refresh operation is performed on the additional address when the multiplexer connects the address scrambler to the output node thereof.
An apparatus comprising:
- a refresh address control circuit configured to provide a row hammer address;
- a refresh control circuit configured to perform a row hammer refresh operation on a refresh address of a memory array related to the row hammer address;
- wherein the refresh address control circuit comprises:
- a plurality of first latch circuits, each of the plurality of first latch circuits being configured to store an old address that was used to access the memory array;
- and
- a second latch circuit configured to store a new address in detection that the new address matches the old address stored in any one of the plurality of first latch circuits;
- wherein the row hammer address is produced based on the new address stored in the second latch circuit.
Dependencies are inferred from the claim text.