Back to results
US 10,008,232 B2Granted
Recording medium, method of manufacturing fullerene thin film, recording reproducing apparatus, information recording method, and information reading method
AssigneeShowa Denko K.K.
InventorsSho Tonegawa, Masatoshi Ichikawa, Kenzo Hanawa
Life of this patent
Estimating the term…
Abstract
According to the present invention, there is provided a recording medium comprising a substrate, a platinum layer formed on the substrate and having a (111) plane preferentially oriented, and a fullerene single crystal thin film formed on the platinum layer, and configured to be a recording layer, wherein an average value of average surface roughness Ra's with respect to four or more visual fields measured by using an atomic force microscope in a surface of the fullerene thin film is 0.5 nm or less.
Claims11
A recording medium comprising:
- a substrate;
- a platinum layer formed on the substrate and having a (111) plane preferentially oriented;
- and
- a fullerene thin film formed on the platinum layer and configured to be a recording layer,
- wherein an average value of average surface roughness Ra's with respect to four or more visual fields measured by using an atomic force microscope in a surface of the fullerene thin film is 0.5 nm or less.
2 more elements
Dependencies are inferred from the claim text.